SNOAA62A February   2023  – February 2023 LMP7704-SP

 

  1.   Abstract
  2.   Trademarks
  3. 1Overview
  4. 2SEE Mechanisms
  5. 3Test Device and Test Board Information
  6. 4Irradiation Facility and Setup
  7. 5SEL Results
  8. 6SET Results
  9. 7Summary
  10.   A Confidence Interval Calculations
  11.   B References
  12.   C Revision History

Abstract

This study characterizes the various Single-Event Effects (SEE) of heavy-ion irradiation of the LMP7704-SP. This device is a radiation-hardened, quad-channel, low offset voltage, rail-to-rail input and output (RRIO) precision amplifier with a CMOS input stage. No incidences of Single-Event Latch-up (SEL) were detected up to LETEFF = 85 MeV-cm2/mg at 125°C. Single-Event Transients (SET) were detected and characterized from LETEFF 2 to 85 MeV-cm2/mg at 25°C.