SN65220-Q1 is not recommended for new designs.
This product continues to be in production to support existing customers. Please consider one of these alternatives:
Similar but not functionally equivalent to the compared device:
TPD2E2U06-Q1 ACTIVE Automotive dual-channel high-speed ESD protection device This product is an automotive dual-channel high-speed ESD protection device.

Product details


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  • Qualified for Automotive Applications
  • Design to Protect Submicron 3-V or 5-V Circuits from Noise Transients
  • Port ESD Protection Capability Exceeds:
    • 15-kV Human Body Model
    • 2-kV Machine Model
  • Available in a WCSP Chip-Scale Package
  • Stand-Off Voltage . . . 6 V Min
  • Low Current Leakage . . . 1 µA Max at 6 V
  • Low Capacitance . . . 35 pF Typ
    • USB 1.1 Host, Hub, or Peripheral Ports

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The SN65220 is a single transient voltage suppressor designed to provide electrical noise transient protection to universal serial bus (USB) 1.1 ports. Note that the input capacitance of the device makes it unsuitable for high-speed USB 2.0 applications.

Any cabled I/O can be subjected to electrical noise transients from various sources. These noise transients can cause damage to the USB transceiver and/or the USB ASIC if they are of sufficient magnitude and duration.

USB ports are typically implemented in 3-V or 5-V digital CMOS with limited ESD protection. The SN65220 can significantly increase the port ESD protection level and reduce the risk of damage to the circuits of the USB port. The IEC1000-4-2 ESD performance of the SN65220 is measured at the system level. Therefore, system design impacts the results of these tests. A high compliance level may be attained with proper board design and layout.

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Technical documentation

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Type Title Date
* Datasheet USB Port Transient Suppressors datasheet (Rev. A) Jun. 23, 2008
Selection guides System-Level ESD Protection Guide (Rev. C) Feb. 20, 2018
Technical articles Circuit-protection basics Mar. 25, 2016
White papers Designing USB for short-to-battery tolerance in automotive environments Feb. 10, 2016

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