Product details

Configuration 8:1 Number of channels 1 Power supply voltage - single (V) 5, 12 Power supply voltage - dual (V) +/-5 Protocols Analog Ron (typ) (Ω) 75 CON (typ) (pF) 13 ON-state leakage current (max) (µA) 1 Supply current (typ) (µA) 1.9 Operating temperature range (°C) -55 to 125 Features 1.8-V compatible control inputs, Break-before-make Input/output continuous current (max) (A) 0.01 Rating Space Supply voltage (max) (V) 15
Configuration 8:1 Number of channels 1 Power supply voltage - single (V) 5, 12 Power supply voltage - dual (V) +/-5 Protocols Analog Ron (typ) (Ω) 75 CON (typ) (pF) 13 ON-state leakage current (max) (µA) 1 Supply current (typ) (µA) 1.9 Operating temperature range (°C) -55 to 125 Features 1.8-V compatible control inputs, Break-before-make Input/output continuous current (max) (A) 0.01 Rating Space Supply voltage (max) (V) 15
SOT-23-THN (DYY) 16 8.4 mm² 4.2 x 2
  • VID V62/26609-01XE
  • Space enhanced plastic
    • Supports Defense and Aerospace Applications
    • Operating temperature from –55°C to +125°C
    • Controlled baseline
    • Au (gold) bondwire and NiPdAu lead finish
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability
    • Enhanced mold compound for low outgassing
    • Meets NASA ASTM E595 outgassing specification
  • Total ionizing dose characterized at 30krad (Si)
    • Total ionizing dose radiation lot acceptance (TID RLAT) for every wafer lot to 30krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 47MeV-cm2/mg
    • Single event transient (SET) characterization report available
  • Single supply range: 5V to 15V
  • Dual supply range: up to ±6V
  • Low capacitance: 3pF
  • Bidirectional signal path
  • Rail-to-rail operation
  • 1.8V logic compatible
  • Break-before-make switching
  • ESD protection HBM: 2000V
  • VID V62/26609-01XE
  • Space enhanced plastic
    • Supports Defense and Aerospace Applications
    • Operating temperature from –55°C to +125°C
    • Controlled baseline
    • Au (gold) bondwire and NiPdAu lead finish
    • One fabrication, assembly, and test site
    • Extended product life cycle
    • Product traceability
    • Enhanced mold compound for low outgassing
    • Meets NASA ASTM E595 outgassing specification
  • Total ionizing dose characterized at 30krad (Si)
    • Total ionizing dose radiation lot acceptance (TID RLAT) for every wafer lot to 30krad (Si)
  • Single-event effects (SEE) characterized:
    • Single event latch-up (SEL) immune to linear energy transfer (LET) = 47MeV-cm2/mg
    • Single event transient (SET) characterization report available
  • Single supply range: 5V to 15V
  • Dual supply range: up to ±6V
  • Low capacitance: 3pF
  • Bidirectional signal path
  • Rail-to-rail operation
  • 1.8V logic compatible
  • Break-before-make switching
  • ESD protection HBM: 2000V

The TMUX182-SEP device is general purpose complementary metal-oxide semiconductor (CMOS) multiplexer (MUX). The device works with a single supply (5V to 15V), dual supplies (up to ±6V), or asymmetric supplies (such as VDD = 6V, VSS = –3V). The wide supply voltage range allows the devices to be used in a broad array of applications in space.

The TMUX182-SEP supports bidirectional analog signals on the source (Sx) and drain (Dx) pins ranging from VSS to VDD. All logic inputs have 1.8V logic compatible thresholds, which is compatible for both TTL and CMOS logic when operating with a valid supply voltage.

The TMUX182-SEP device is general purpose complementary metal-oxide semiconductor (CMOS) multiplexer (MUX). The device works with a single supply (5V to 15V), dual supplies (up to ±6V), or asymmetric supplies (such as VDD = 6V, VSS = –3V). The wide supply voltage range allows the devices to be used in a broad array of applications in space.

The TMUX182-SEP supports bidirectional analog signals on the source (Sx) and drain (Dx) pins ranging from VSS to VDD. All logic inputs have 1.8V logic compatible thresholds, which is compatible for both TTL and CMOS logic when operating with a valid supply voltage.

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Technical documentation

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* Data sheet TMUX182-SEP Radiation Tolerant 15V, 8:1, 1-Channel Multiplexer With 1.8V Logic datasheet (Rev. A) PDF | HTML 20 May 2026
* Radiation & reliability report TMUX182-SEP Single-Event Effects (SEE) Radiation Report PDF | HTML 27 Apr 2026
* Radiation & reliability report TMUX182-SEP Total Ionizing Dose (TID) Report 27 Apr 2026
* Radiation & reliability report TMUX182-SEP Production Flow and Reliability Report PDF | HTML 02 Apr 2026
Application note Space ADC Circuit Cookbook PDF | HTML 11 May 2026

Design & development

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Evaluation board

16DYYPWEVM — Test board for SOT-23 THIN (DYY) and TSSOP (PW) packages

The 16DYYPWEVM test board provides a dual footprint for SOT-23 THIN (DYY) and TSSOP (PW) packages.  This test board is used for quick prototyping and testing of integrated ciructs in 16 pin SOT-23 THIN (DYY) and TSSOP (PW) packages. 
User guide: PDF
Not available on TI.com
Evaluation board

TMUXBQB-DYYEVM — Generic TMUX evaluation module for 16-pin BQB, DYY and PW packages

The TMUXBQB-DYYEVM allows for the quick prototyping and DC characterization of our line of TMUX products that use the 16-pin TSSOP (PW), WQFN (BQB) and SOT-23 THIN (DYY) packages.

User guide: PDF | HTML
Not available on TI.com
Package Pins CAD symbols, footprints & 3D models
SOT-23-THN (DYY) 16 Ultra Librarian

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