TIPD147
Noise Measurement Post-Amp for Oscilloscope or Spectrum Analyzer
TIPD147
Overview
In some cases a scope or spectrum analyzer does not have the range required to measure very small noise levels. This noise measurement post-amp boosts the output noise of the device under test (DUT) to allow for measurement with standard test equipment. The key requirements of this circuit is that it has a low noise floor and sufficient bandwidth for characterization of most devices.
Features
- Test Circuit to amplify noise above instrument noise floor
- Wide bandwidth 0.016Hz to 443kHz
A fully assembled board has been developed for testing and performance validation only, and is not available for sale.
Design files & products
Design files
Download ready-to-use system files to speed your design process.
TIDR333.PDF (62 K)
Detailed schematic diagram for design layout and components
TIDC207.ZIP (34 K)
Detailed schematic diagram for design layout and components
TIDR356.PDF (188 K)
Complete listing of design components, reference designators, and manufacturers/part numbers
Products
Includes TI products in the design and potential alternatives.
Start development
Technical documentation
= Top documentation selected by TI
No results found. Please clear your search and try again.
View all 2
| Type | Title | Date | ||
|---|---|---|---|---|
| * | User guide | Noise Measurement Post-Amp Design Guide | Dec. 10, 2013 | |
| Technical article | Stress-induced outbursts: Microphonics in ceramic capacitors (Part 2) | Dec. 23, 2014 |
Support & training
TI E2E™ forums with technical support from TI engineers
Content is provided "as is" by TI and community contributors and does not constitute TI specifications. See terms of use.
If you have questions about quality, packaging or ordering TI products, see TI support.