SLASF44 may   2023 AFE78201 , AFE88201

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics
    6. 6.6  Timing Requirements
    7. 6.7  Timing Diagrams
    8. 6.8  Typical Characteristics: VOUT DAC
    9. 6.9  Typical Characteristics: ADC
    10. 6.10 Typical Characteristics: Reference
    11. 6.11 Typical Characteristics: Power Supply
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Digital-to-Analog Converter (DAC) Overview
        1. 7.3.1.1 DAC Resistor String
        2. 7.3.1.2 DAC Buffer Amplifier
        3. 7.3.1.3 DAC Transfer Function
        4. 7.3.1.4 DAC Gain and Offset Calibration
        5. 7.3.1.5 Programmable Slew Rate
        6. 7.3.1.6 DAC Register Structure and CLEAR State
      2. 7.3.2  Analog-to-Digital Converter (ADC) Overview
        1. 7.3.2.1 ADC Operation
        2. 7.3.2.2 ADC Custom Channel Sequencer
        3. 7.3.2.3 ADC Synchronization
        4. 7.3.2.4 ADC Offset Calibration
        5. 7.3.2.5 External Monitoring Inputs
        6. 7.3.2.6 Temperature Sensor
        7. 7.3.2.7 Self-Diagnostic Multiplexer
        8. 7.3.2.8 ADC Bypass
      3. 7.3.3  Programmable Out-of-Range Alarms
        1. 7.3.3.1 Alarm-Based Interrupts
        2. 7.3.3.2 Alarm Action Configuration Register
        3. 7.3.3.3 Alarm Voltage Generator
        4. 7.3.3.4 Temperature Sensor Alarm Function
        5. 7.3.3.5 Internal Reference Alarm Function
        6. 7.3.3.6 ADC Alarm Function
        7. 7.3.3.7 Fault Detection
      4. 7.3.4  IRQ
      5. 7.3.5  Internal Reference
      6. 7.3.6  Integrated Precision Oscillator
      7. 7.3.7  Precision Oscillator Diagnostics
      8. 7.3.8  One-Time Programmable (OTP) Memory
      9. 7.3.9  GPIO
      10. 7.3.10 Timer
      11. 7.3.11 Unique Chip Identifier (ID)
      12. 7.3.12 Scratch Pad Register
    4. 7.4 Device Functional Modes
      1. 7.4.1 Register Built-In Self-Test (RBIST)
      2. 7.4.2 DAC Power-Down Mode
      3. 7.4.3 Reset
    5. 7.5 Programming
      1. 7.5.1 Communication Setup
        1. 7.5.1.1 SPI Mode
        2. 7.5.1.2 UART Mode
      2. 7.5.2 GPIO Programming
      3. 7.5.3 Serial Peripheral Interface (SPI)
        1. 7.5.3.1 SPI Frame Definition
        2. 7.5.3.2 SPI Read and Write
        3. 7.5.3.3 Frame Error Checking
        4. 7.5.3.4 Synchronization
      4. 7.5.4 UART Interface
        1. 7.5.4.1 UART Break Mode (UBM)
      5. 7.5.5 Status Bits
      6. 7.5.6 Watchdog Timer
    6. 7.6 Register Maps
      1. 7.6.1 AFEx8201 Registers
  8. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Multichannel Configuration
    2. 8.2 Typical Application
      1. 8.2.1 Analog Output Module
        1. 8.2.1.1 Design Requirements
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1 XTR305
            1. 8.2.1.2.1.1 Current-Output Mode
            2. 8.2.1.2.1.2 Voltage Output Mode
            3. 8.2.1.2.1.3 Diagnostic Features
        3. 8.2.1.3 Application Curves
    3. 8.3 Initialization Setup
    4. 8.4 Power Supply Recommendations
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
      2. 8.5.2 Layout Example
  9. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  10. 10Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

7.3.2.8 ADC Bypass

To test the offset, modify the ADC data path by programming the bypass data register, ADC_BYP.DATA (2Eh). This read/write register is used in two different ways.

First, by setting the ADC_BYP.OFST_BYP_EN to 1, this bypass data register is used as a substitute for the ADC_OFFSET. However, if the ADC_BYP.DATA data must be stored in the ADC_OFFSET register, use the second method.

Second, the ADC_BYP.DATA is used to set a known value into the ADC readback register of the channel being converted. Write the desired data into ADC_BYP.DATA, set the ADC_BYP.DATA_BYP_EN bit, and convert the selected channel. When ADC_BYP.DATA_BYP_EN bit is set to 1, the ADC conversion is bypassed, and the value of ADC_BYP.DATA is written into the selected ADC channel readback register. This setting is used to test the alarm settings of the ADC.

When the ADC bypass is unused, set the ADC_BYP.DATA to 000h.

Figure 7-21 shows the ADC bypass data flow.

GUID-20220626-SS0I-RFZJ-PZNS-P7QXMSL7G6FZ-low.svg Figure 7-11 ADC Bypass Data Flow