SLVSA96A
September 2015 – March 2016
TLC59291
PRODUCTION DATA.
1
Features
2
Applications
3
Description
4
Revision History
5
Pin Configuration and Functions
6
Specifications
6.1
Absolute Maximum Ratings
6.2
ESD Ratings
6.3
Recommended Operating Conditions
6.4
Thermal Information
6.5
Electrical Characteristics
6.6
Switching Characteristics
6.7
Timing Diagrams
6.8
Typical Characteristics
7
Parameter Measurement Information
8
Detailed Description
8.1
Overview
8.2
Functional Block Diagram
8.3
Feature Description
8.3.1
Maximum Constant Sink Current
8.3.2
Global Brightness Control (BC) Function
8.3.3
Thermal Shutdown (TSD) and Thermal Error Flag (TEF)
8.3.4
Pre-Thermal Warning (PTW)
8.3.5
Current Reference Terminal - IREF Terminal - Short Flag (ISF)
8.3.6
Noise Reduction
8.4
Device Functional Modes
8.4.1
Blank Mode Selection (BLKMS)
8.4.2
Power-Save Mode
8.4.3
LED Open Detection (LOD)
8.4.4
LED Short Detection (LSD)
8.4.5
Invisible Detection Mode (IDM)
8.4.6
Output Leakage Detection (OLD)
8.4.7
Status Information Data (SID)
8.5
Register Maps
8.5.1
Register and Data Latch Configuration
8.5.1.1
Common Shift Register
8.5.1.2
Output On/Off Data Latch
8.5.1.3
Control Data Latch
8.5.1.4
Output On/Off Data Write Timing and Output Control
8.5.1.5
Function Control Data Writing
8.5.1.6
Function Control (FC) Data
9
Application and Implementation
9.1
Application Information
9.2
Typical Application
9.2.1
Design Requirements
9.2.2
Detailed Design Procedure
9.2.3
Application Curves
10
Power Supply Recommendations
11
Layout
11.1
Layout Guidelines
11.2
Layout Example
12
Device and Documentation Support
12.1
Documentation Support
12.2
Community Resources
12.3
Trademarks
12.4
Electrostatic Discharge Caution
12.5
Glossary
13
Mechanical, Packaging, and Orderable Information
パッケージ・オプション
メカニカル・データ(パッケージ|ピン)
RGE|24
MPQF124G
サーマルパッド・メカニカル・データ
RGE|24
QFND008AA
発注情報
slvsa96a_oa
7 Parameter Measurement Information
1.
NOINDENT:
C
L
includes measurement probe and jig capacitance.
Figure 26. Rise Time and Fall Time Test Circuit for OUT
n
1.
NOINDENT:
C
L
includes measurement probe and jig capacitance.
Figure 27. Rise Time and Fall Time Test Circuit for SOUT
Figure 28. Constant-Current Test Circuit for OUT
n