SLVK126C january   2023  – august 2023 TPS7H1111-SP

PRODUCTION DATA  

  1.   1
  2.   TPS7H1111-SP Total Ionizing Dose (TID)
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Facility
    3. 2.3 Test Setup Details
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Data Sheet Electrical Parameters and Associated Tests
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8. 5Revision History
  9.   A Appendix A: HDR TID Report Data
  10.   B Appendix B: LDR TID Report Data

2.2 Test Facility

The TPS7H1111-SP HDR exposure was performed on biased and unbiased devices in a Co-60 gamma cell at Texas Instruments in Dallas, Texas. The dose rate for exposure was between 50-300 rad(Si)/s. After exposure up to the target dose rate, the devices were electrically tested at Texas Instruments. ATE test limits are set per SMD electrical limits based on qualification and characterization data. As shown in Table 1-1 the 100krad(Si) biased and unbiased devices were annealed with the respective biased and unbiased conditions for one week. The effective dose rate for these devices was 165 mrad(Si)/s.
The TPS7H1111-SP LDR exposure was performed on biased and unbiased devices in a Co-60 gammacell under a 10-mrad(Si)/s exposure rate. The dose rate of the irradiator used in the exposure ranges from < 10 mrad(Si)/s to a maximum of approximately 84 rad(Si)/s, determined by the distance from the source. For the LDR (10 mrad(Si)/s) exposure, the test box was positioned approximately 2 m from the source. The exposure boards are housed in a lead-aluminum box (as specified in MIL-STD-883 TM 1019.9) to harden the gamma spectrum and minimize dose enhancement effects. The irradiator calibration is maintained by Logmire Laboratories using Thermoluminescence Dosimeters (TLDs) traceable to the National Institute of Standards and Technology (NIST) and the dosimetry was verified using TLDs prior to the radiation exposures. After exposure, devices were electrically tested at Texas Instruments. ATE test limits are set per SMD electrical limits based on qualification and characterization data.