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Interruptores y multiplexores
Demultiplexores y decodificadores digitales

CD4511B-MIL

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Controladores de decodificador de cierre de LED CMOS de BCD a 7 segmentos

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CD4511B-MIL

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Detalles del producto

Technology family CD4000 Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Military Supply current (max) (µA) 3000
Technology family CD4000 Number of channels 1 Operating temperature range (°C) -55 to 125 Rating Military Supply current (max) (µA) 3000
CDIP (J) 16 135.3552 mm² 19.56 x 6.92
  • High-output-sourcing capability............up to 25 mA
  • Input latches for BCD Code storage
  • Lamp Test and Blanking capability
  • 7-segment outputs blanked for BCD input codes > 1001
  • 100% tested for quiescent current at 20 V
  • Max. input current of 1 µA at 18 V, over full package-temperature range, 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Applications
    • Driving common-cathode LED displays
    • Multiplexing with common-cathode LED displays
    • Driving incandescent displays
    • Driving low-voltage fluorescent displays
  • High-output-sourcing capability............up to 25 mA
  • Input latches for BCD Code storage
  • Lamp Test and Blanking capability
  • 7-segment outputs blanked for BCD input codes > 1001
  • 100% tested for quiescent current at 20 V
  • Max. input current of 1 µA at 18 V, over full package-temperature range, 100 nA at 18 V and 25°C
  • 5-V, 10-V, and 15-V parametric ratings
  • Applications
    • Driving common-cathode LED displays
    • Multiplexing with common-cathode LED displays
    • Driving incandescent displays
    • Driving low-voltage fluorescent displays

CD4511B types are BCD-to-7-segment latch decoder drivers constructed with CMOS logic and n-p-n bipolar transistor output devices on a single monolithic structure. These devices combine the low quiescent power dissipation and high noise immunity features of RCA CMOS with n-p-n bipolar output transistors capable of sourcing up to 25 MA. This capability allows the CD4511B types to drive LED's and other displays directly.

Lamp Test (LT)\, Blanking (BL)\, and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used.

The CD4511B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (NSR suffix), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

These devices are similar to the type MC14511.

CD4511B types are BCD-to-7-segment latch decoder drivers constructed with CMOS logic and n-p-n bipolar transistor output devices on a single monolithic structure. These devices combine the low quiescent power dissipation and high noise immunity features of RCA CMOS with n-p-n bipolar output transistors capable of sourcing up to 25 MA. This capability allows the CD4511B types to drive LED's and other displays directly.

Lamp Test (LT)\, Blanking (BL)\, and Latch Enable or Strobe inputs are provided to test the display, shut off or intensity-modulate it, and store or strobe a BCD code, respectively. Several different signals may be multiplexed and displayed when external multiplexing circuitry is used.

The CD4511B types are supplied in 16-lead hermetic dual-in-line ceramic packages (F3A suffix), 16-lead dual-in-line plastic packages (E suffix), 16-lead small-outline packages (NSR suffix), and 16-lead thin shrink small-outline packages (PW and PWR suffixes).

These devices are similar to the type MC14511.
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Documentación técnica

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Tipo Título Fecha
* Data sheet CMOS BCD-to-7-Segment Latch Decoder Drivers datasheet (Rev. B) 27 jun 2003
Selection guide Logic Guide (Rev. AB) 12 jun 2017
Application note Understanding and Interpreting Standard-Logic Data Sheets (Rev. C) 02 dic 2015
User guide LOGIC Pocket Data Book (Rev. B) 16 ene 2007
Application note Semiconductor Packing Material Electrostatic Discharge (ESD) Protection 08 jul 2004
User guide Signal Switch Data Book (Rev. A) 14 nov 2003
Application note Understanding Buffered and Unbuffered CD4xxxB Series Device Characteristics 03 dic 2001

Diseño y desarrollo

Para conocer los términos adicionales o los recursos necesarios, haga clic en cualquier título de abajo para ver la página de detalles cuando esté disponible.

Diseños de referencia

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Guía del usuario: PDF
Esquema: PDF
Paquete Pasadores Descargar
CDIP (J) 16 Ver opciones
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Pedidos y calidad

Información incluida:
  • RoHS
  • REACH
  • Marcado del dispositivo
  • Acabado de plomo/material de la bola
  • Clasificación de nivel de sensibilidad a la humedad (MSL) / reflujo máximo
  • Estimaciones de tiempo medio entre fallas (MTBF)/fallas en el tiempo (FIT)
  • Contenido del material
  • Resumen de calificaciones
  • Monitoreo continuo de confiabilidad
Información incluida:
  • Lugar de fabricación
  • Lugar de ensamblaje

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