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數據轉換器
數位轉類比轉換器 (DAC)
精密 DAC (≤10 MSPS)

TLV5618A-EP

現行

具有斷電功能的強化型產品數位轉類比轉換器

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TLV5618A-EP

現行
產品規格表 立即訂購

產品詳細資料

Resolution (Bits) 12 Number of DAC channels 2 Interface type SPI Output type Buffered Voltage Settling time (µs) 3 Reference type Ext Architecture String Rating HiRel Enhanced Product Output range (max) (mA/V) 5.1 Output range (min) (mA/V) 0 Sample/update rate (Msps) 0.093 Power consumption (typ) (mW) 1.8 Operating temperature range (°C) -55 to 125
Resolution (Bits) 12 Number of DAC channels 2 Interface type SPI Output type Buffered Voltage Settling time (µs) 3 Reference type Ext Architecture String Rating HiRel Enhanced Product Output range (max) (mA/V) 5.1 Output range (min) (mA/V) 0 Sample/update rate (Msps) 0.093 Power consumption (typ) (mW) 1.8 Operating temperature range (°C) -55 to 125
SOIC (D) 8 29.4 mm² 4.9 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Dual 12-Bit Voltage Output DAC
  • Programmable Settling Time
    • 3 µs in Fast Mode
    • 10 µs in Slow Mode
  • Compatible With TMS320 and SPI Serial Ports
  • Differential Nonlinearity <0.5 LSB Typ
  • Monotonic Over Temperature
  • Direct Replacement for TLC5618A
  • applications
    • Digital Servo Control Loops
    • Digital Offset and Gain Adjustment
    • Industrial Process Control
    • Machine and Motion Control Devices
    • Mass Storage Devices

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • Dual 12-Bit Voltage Output DAC
  • Programmable Settling Time
    • 3 µs in Fast Mode
    • 10 µs in Slow Mode
  • Compatible With TMS320 and SPI Serial Ports
  • Differential Nonlinearity <0.5 LSB Typ
  • Monotonic Over Temperature
  • Direct Replacement for TLC5618A
  • applications
    • Digital Servo Control Loops
    • Digital Offset and Gain Adjustment
    • Industrial Process Control
    • Machine and Motion Control Devices
    • Mass Storage Devices

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.

The TLV5618A is a dual 12-bit voltage output DAC with a flexible 3-wire serial interface. The serial interface is compatible with TMS320, SPI™, QSPI™, and Microwire™ serial ports. It is programmed with a 16-bit serial string containing 4 control and 12 data bits.

The resistor string output voltage is buffered by an x2 gain rail-to-rail output buffer. The buffer features a Class-AB output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows the designer to optimize speed versus power dissipation.

Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It is available in an 8-pin SOIC package.

The TLV5618AM is characterized for operation from –55°C to 125°C.

The TLV5618A is a dual 12-bit voltage output DAC with a flexible 3-wire serial interface. The serial interface is compatible with TMS320, SPI™, QSPI™, and Microwire™ serial ports. It is programmed with a 16-bit serial string containing 4 control and 12 data bits.

The resistor string output voltage is buffered by an x2 gain rail-to-rail output buffer. The buffer features a Class-AB output stage to improve stability and reduce settling time. The programmable settling time of the DAC allows the designer to optimize speed versus power dissipation.

Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It is available in an 8-pin SOIC package.

The TLV5618AM is characterized for operation from –55°C to 125°C.
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類型 標題 日期
* Data sheet TLV5618A-EP: Digital-to-Aanalog Converter with Power Down datasheet 2003年 10月 20日
* VID TLV5618A-EP VID V6204646 2016年 6月 21日
* Radiation & reliability report TLV5618AMDREP Reliability Report (Rev. A) 2012年 4月 5日

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計算工具

ANALOG-ENGINEER-CALC — 類比工程師計算機

The Analog Engineer’s Calculator is designed to speed up many of the repetitive calculations that analog circuit design engineers use on a regular basis. This PC-based tool provides a graphical interface with a list of various common calculations ranging from setting op-amp gain with feedback (...)
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模擬工具

PSPICE-FOR-TI — PSpice® for TI 設計與模擬工具

PSpice® for TI is a design and simulation environment that helps evaluate functionality of analog circuits. This full-featured, design and simulation suite uses an analog analysis engine from Cadence®. Available at no cost, PSpice for TI includes one of the largest model libraries in the (...)
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模擬工具

TINA-TI — 基於 SPICE 的類比模擬程式

TINA-TI provides all the conventional DC, transient and frequency domain analysis of SPICE and much more. TINA has extensive post-processing capability that allows you to format results the way you want them. Virtual instruments allow you to select input waveforms and probe circuit nodes voltages (...)
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