Memory and semiconductor test equipment

Memory and Semiconductor Test Equipment integrated circuits and reference designs

Description

Our integrated circuits and reference designs help you create high accuracy testers at wafer, package and board levels enabling dense solutions for a high number of channels while minimizing channel-to-channel variation.

    Next generation semiconductor testers often require:

  • Highest levels of speed and accuracy through data acquisition channels
  • Tight temperature controls to minimize measurement drift
  • Precise reference voltage generation to improve measurement accuracy
  • Low jitter clock distribution to maximize SNR performance
  • Highly integrated, low-height power modules minimizing board-to-board spacing

Technical documents

Application notes & user guides

Application Notes (10)

Title Abstract Type Size (KB) Date Views
PDF 108 KB 31 Aug 2018 0
PDF 213 KB 18 Sep 2017 0
PDF 795 KB 20 Jul 2017 0
HTM 8 KB 14 Jun 2017 0
PDF 177 KB 03 Jan 2017 0
HTM 8 KB 17 May 2016 0
HTM 8 KB 16 Apr 2015 0
HTM 9 KB 10 Sep 2010 0
PDF 285 KB 28 Feb 2005 0
HTM 8 KB 14 Jun 2004 0

Product bulletin & white papers

White Papers (6)

Title Abstract Type Size (MB) Date Views
PDF 688 KB 01 Feb 2018 0
PDF 149 KB 08 Nov 2016 0
PDF 1.25 MB 15 Sep 2016 0
PDF 3.07 MB 01 Aug 2016 0
PDF 2.13 MB 31 Mar 2016 0
PDF 1011 KB 26 Jan 2016 0

Blogs

Support & training

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