LCD Test Equipment

LCD Test Equipment integrated circuits and reference designs


Our integrated circuits and reference designs help you create high-density, high-performance, multi-channel liquid crystal display (LCD) test equipment that minimizes channel-to-channel variations due to reference voltage loading, clocking and power.

    New generation LCD test equipment often requires:

  • Simultaneous high-precision, high-voltage, multi-channel measurement capabilities
  • Minimum channel-to-channel variation during measurement
  • High current drive precision voltage generation for the shorting bar test
  • Highly integrated, efficient and low EMI power architectures

Technical documents

Application notes & user guides

Application Notes (4)

Title Abstract Type Size (KB) Date Views
HTM 8 KB 14 Jun 2017 91
PDF 111 KB 09 Feb 2017 618
HTM 9 KB 19 Sep 2016 425
HTM 8 KB 16 Apr 2015 369

Product bulletin & white papers

White Papers (3)

Title Abstract Type Size (MB) Date Views
PDF 1.25 MB 15 Sep 2016 386
PDF 1011 KB 26 Jan 2016 178
PDF 697 KB 17 Jun 2014 550

Similar end equipment solutions

TI End-Equipment

All TI End-Equipment Solutions

Support & training

Try our support forums.
Search expert answers for this part Ask a new question

Content is provided 'AS IS' by the respective TI and Community contributors and does not constitute TI specifications.
See terms of use.

Other Support

Blogs & authored articles