LCD test equipment

LCD Test Equipment integrated circuits and reference designs

Description

Our integrated circuits and reference designs help you create high-density, high-performance, multi-channel liquid crystal display (LCD) test equipment that minimizes channel-to-channel variations due to reference voltage loading, clocking and power.

    New generation LCD test equipment often requires:

  • Simultaneous high-precision, high-voltage, multi-channel measurement capabilities
  • Minimum channel-to-channel variation during measurement
  • High current drive precision voltage generation for the shorting bar test
  • Highly integrated, efficient and low EMI power architectures

Technical documents

Application notes & user guides

Application Notes (4)

Title Abstract Type Size (KB) Date Views
PDF 108 KB 31 Aug 2018 0
HTM 8 KB 14 Jun 2017 0
HTM 9 KB 19 Sep 2016 0
HTM 8 KB 16 Apr 2015 0

Product bulletin & white papers

White Papers (3)

Title Abstract Type Size (MB) Date Views
PDF 1.2 MB 23 Oct 2018 0
PDF 1.25 MB 15 Sep 2016 0
PDF 1011 KB 26 Jan 2016 0

Blogs

Support & training

Search our extensive online knowledge base where millions of technical questions and answers are available 24/7.

Search answers from TI experts

Content is provided 'AS IS' by the respective TI and Community contributors and does not constitute TI specifications.
See terms of use.

If you have questions about quality, packaging, or ordering TI products visit our Support page.