Wireless Communications Test Equipment

Block Diagram (SBD) for a tester of physical layer and lower layer functionality of different wireless communications technologies.

Description

Below find Integrated circuits and reference designs for wireless communications test equipment (WCTE) complete with schematics, test data and design files which:

  • Demonstrate the design methodology using TI high speed, direct RF-sampling data converters and amplifiers
  • Highlight the use of ultra-low jitter programmable clock generators for clocking the high speed data converters for single and multichannel WCTE applications
  • Show how various high performance amplifiers and variable gain amplifiers can be used to convert balanced input to differential output with adequate gain

Technical documents

Application notes & user guides

Application Notes (6)

Title Abstract Type Size (KB) Date Views
PDF 429 KB 26 Apr 2017 1258
HTM 8 KB 17 May 2016 508
HTM 8 KB 12 Jan 2016 185
HTM 9 KB 10 Sep 2010 468
PDF 166 KB 28 Feb 2005 143
HTM 8 KB 22 Apr 2004 195

Tools & Software

Name Part # Company Software/Tool Type
Data Capture / Pattern Generator: Data Converter EVMs With 16 JESD204B Lanes From 1.6-15Gbps TSW14J57EVM Texas Instruments Evaluation Modules & Boards
Data Capture / Pattern Generator: Data Converter EVMs With 8 JESD204B Lanes From 0.6-12.5Gbps TSW14J56EVM Texas Instruments Evaluation Modules & Boards
Data Capture / Pattern Generator: Data Converter EVMs With 8 JESD204B Lanes From 0.6-6.5Gbps TSW14J50EVM Texas Instruments Evaluation Modules & Boards

Product bulletin & white papers

White Papers (6)

Title Abstract Type Size (MB) Date Views
PDF 4.63 MB 12 Aug 2016 460
PDF 3.33 MB 19 Mar 2015 728
PDF 1.13 MB 11 Feb 2015 356
PDF 91 KB 01 May 2007 303
PDF 587 KB 01 Feb 2005 92
PDF 342 KB 01 Feb 2004 110

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