SLVSEN9E April   2019  – February 2023 ADC12DJ5200RF

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Pin Configuration and Functions
  6. 6 Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics: DC Specifications
    6. 6.6  Electrical Characteristics: Power Consumption
    7. 6.7  Electrical Characteristics: AC Specifications (Dual-Channel Mode)
    8. 6.8  Electrical Characteristics: AC Specifications (Single-Channel Mode)
    9. 6.9  Timing Requirements
    10. 6.10 Switching Characteristics
    11. 6.11 Typical Characteristics
  7. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  Device Comparison
      2. 7.3.2  Analog Inputs
        1. 7.3.2.1 Analog Input Protection
        2. 7.3.2.2 Full-Scale Voltage (VFS) Adjustment
        3. 7.3.2.3 Analog Input Offset Adjust
      3. 7.3.3  ADC Core
        1. 7.3.3.1 ADC Theory of Operation
        2. 7.3.3.2 ADC Core Calibration
        3. 7.3.3.3 Analog Reference Voltage
        4. 7.3.3.4 ADC Overrange Detection
        5. 7.3.3.5 Code Error Rate (CER)
      4. 7.3.4  Temperature Monitoring Diode
      5. 7.3.5  Timestamp
      6. 7.3.6  Clocking
        1. 7.3.6.1 Noiseless Aperture Delay Adjustment (tAD Adjust)
        2. 7.3.6.2 Aperture Delay Ramp Control (TAD_RAMP)
        3. 7.3.6.3 SYSREF Capture for Multi-Device Synchronization and Deterministic Latency
          1. 7.3.6.3.1 SYSREF Position Detector and Sampling Position Selection (SYSREF Windowing)
          2. 7.3.6.3.2 Automatic SYSREF Calibration
      7. 7.3.7  Programmable FIR Filter (PFIR)
        1. 7.3.7.1 Dual Channel Equalization
        2. 7.3.7.2 Single Channel Equalization
        3. 7.3.7.3 Time Varying Filter
      8. 7.3.8  Digital Down Converters (DDC)
        1. 7.3.8.1 Rounding and Saturation
        2. 7.3.8.2 Numerically-Controlled Oscillator and Complex Mixer
          1. 7.3.8.2.1 NCO Fast Frequency Hopping (FFH)
          2. 7.3.8.2.2 NCO Selection
          3. 7.3.8.2.3 Basic NCO Frequency Setting Mode
          4. 7.3.8.2.4 Rational NCO Frequency Setting Mode
          5. 7.3.8.2.5 NCO Phase Offset Setting
          6. 7.3.8.2.6 NCO Phase Synchronization
        3. 7.3.8.3 Decimation Filters
        4. 7.3.8.4 Output Data Format
        5. 7.3.8.5 Decimation Settings
          1. 7.3.8.5.1 Decimation Factor
          2. 7.3.8.5.2 DDC Gain Boost
      9. 7.3.9  JESD204C Interface
        1. 7.3.9.1 Transport Layer
        2. 7.3.9.2 Scrambler
        3. 7.3.9.3 Link Layer
        4. 7.3.9.4 8B/10B Link Layer
          1. 7.3.9.4.1 Data Encoding (8B/10B)
          2. 7.3.9.4.2 Multiframes and the Local Multiframe Clock (LMFC)
          3. 7.3.9.4.3 Code Group Synchronization (CGS)
          4. 7.3.9.4.4 Initial Lane Alignment Sequence (ILAS)
          5. 7.3.9.4.5 Frame and Multiframe Monitoring
        5. 7.3.9.5 64B/66B Link Layer
          1. 7.3.9.5.1 64B/66B Encoding
          2. 7.3.9.5.2 Multiblocks, Extended Multiblocks and the Local Extended Multiblock Clock (LEMC)
          3. 7.3.9.5.3 Block, Multiblock and Extended Multiblock Alignment using Sync Header
            1. 7.3.9.5.3.1 Cyclic Redundancy Check (CRC) Mode
            2. 7.3.9.5.3.2 Forward Error Correction (FEC) Mode
          4. 7.3.9.5.4 Initial Lane Alignment
          5. 7.3.9.5.5 Block, Multiblock and Extended Multiblock Alignment Monitoring
        6. 7.3.9.6 Physical Layer
          1. 7.3.9.6.1 SerDes Pre-Emphasis
        7. 7.3.9.7 JESD204C Enable
        8. 7.3.9.8 Multi-Device Synchronization and Deterministic Latency
        9. 7.3.9.9 Operation in Subclass 0 Systems
      10. 7.3.10 Alarm Monitoring
        1. 7.3.10.1 Clock Upset Detection
        2. 7.3.10.2 FIFO Upset Detection
    4. 7.4 Device Functional Modes
      1. 7.4.1 Dual-Channel Mode
      2. 7.4.2 Single-Channel Mode (DES Mode)
      3. 7.4.3 Dual-Input Single-Channel Mode (DUAL DES Mode)
      4. 7.4.4 JESD204C Modes
        1. 7.4.4.1 JESD204C Operating Modes Table
        2. 7.4.4.2 JESD204C Modes continued
        3. 7.4.4.3 JESD204C Transport Layer Data Formats
        4. 7.4.4.4 64B/66B Sync Header Stream Configuration
        5. 7.4.4.5 Dual DDC and Redundant Data Mode
      5. 7.4.5 Power-Down Modes
      6. 7.4.6 Test Modes
        1. 7.4.6.1 Serializer Test-Mode Details
        2. 7.4.6.2 PRBS Test Modes
        3. 7.4.6.3 Clock Pattern Mode
        4. 7.4.6.4 Ramp Test Mode
        5. 7.4.6.5 Short and Long Transport Test Mode
          1. 7.4.6.5.1 Short Transport Test Pattern
        6. 7.4.6.6 D21.5 Test Mode
        7. 7.4.6.7 K28.5 Test Mode
        8. 7.4.6.8 Repeated ILA Test Mode
        9. 7.4.6.9 Modified RPAT Test Mode
      7. 7.4.7 Calibration Modes and Trimming
        1. 7.4.7.1 Foreground Calibration Mode
        2. 7.4.7.2 Background Calibration Mode
        3. 7.4.7.3 Low-Power Background Calibration (LPBG) Mode
      8. 7.4.8 Offset Calibration
      9. 7.4.9 Trimming
    5. 7.5 Programming
      1. 7.5.1 Using the Serial Interface
        1. 7.5.1.1 SCS
        2. 7.5.1.2 SCLK
        3. 7.5.1.3 SDI
        4. 7.5.1.4 SDO
        5. 7.5.1.5 Streaming Mode
    6. 7.6 SPI Register Map
  8. 8 Application Information Disclaimer
    1. 8.1 Application Information
    2. 8.2 Typical Applications
      1. 8.2.1 Wideband RF Sampling Receiver
        1. 8.2.1.1 Design Requirements
          1. 8.2.1.1.1 Input Signal Path
          2. 8.2.1.1.2 Clocking
        2. 8.2.1.2 Detailed Design Procedure
          1. 8.2.1.2.1 Calculating Values of AC-Coupling Capacitors
        3. 8.2.1.3 Application Curves
      2. 8.2.2 Reconfigurable Dual-Channel 5-GSPS or Single-Channel 10-Gsps Oscilloscope
        1. 8.2.2.1 Design Requirements
          1. 8.2.2.1.1 Input Signal Path
          2. 8.2.2.1.2 Clocking
          3. 8.2.2.1.3 ADC12DJ5200RF
        2. 8.2.2.2 Application Curves
    3. 8.3 Initialization Set Up
  9. 9 Power Supply Recommendations
    1. 9.1 Power Sequencing
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Device Support
      1. 11.1.1 Development Support
        1. 11.1.1.1 146
    2. 11.2 Documentation Support
      1. 11.2.1 Related Documentation
    3. 11.3 Receiving Notification of Documentation Updates
    4. 11.4 Support Resources
    5. 11.5 Trademarks
    6. 11.6 Electrostatic Discharge Caution
    7. 11.7 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information
7.4.6.5.1 Short Transport Test Pattern

Short transport test patterns send a predefined octet format that repeats every frame. In the ADC12DJ5200RF, all JMODE configurations that have an N' value of 8 or 12 use the short transport test pattern. The N' = 8 short transport test pattern is shown in Table 7-59. The N' = 12 test patterns are shown in Table 7-60, Table 7-61 and Table 7-62 which cover different values of F and S. All applicable lanes are shown, however only the enabled lanes (lowest indexed) for the configured JMODE are used.

Table 7-59 Short Transport Test Pattern for N' = 8 Modes (Length = 2 Frames)
FRAME 0 1
DA0 0x00 0xFF
DA1 0x01 0xFE
DA2 0x02 0xFD
DA3 0x03 0xFC
DB0 0x00 0xFF
DB1 0x01 0xFE
DB2 0x02 0xFD
DB3 0x03 0xFC
Table 7-60 Short Transport Test Pattern for N' = 12, F = 8 Modes (Length = 1 Frame)
OCTET 0 1 2 3 4 5 6 7
NIBBLE 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15
DA0 0xF01 0xF02 0xF03 0xF04 0xF05 T
DA1 0xE11 0xE12 0xE13 0xE14 0xE15 T
DA2 0xD21 0xD22 0xD23 0xD24 0xD25 T
DA3 0xC31 0xC32 0xC33 0xC34 0xC35 T
DA4 0xB41 0xB42 0xB43 0xB44 0xB45 T
DA5 0xA51 0xA52 0xA53 0xA54 0xA55 T
DA6 0x961 0x962 0x963 0x964 0x965 T
DA7 0x871 0x872 0x873 0x874 0x875 T
DB0 0xF01 0xF02 0xF03 0xF04 0xF05 T
DB1 0xE11 0xE12 0xE13 0xE14 0xE15 T
DB2 0xD21 0xD22 0xD23 0xD24 0xD25 T
DB3 0xC31 0xC32 0xC33 0xC34 0xC35 T
DB4 0xB41 0xB42 0xB43 0xB44 0xB45 T
DB5 0xA51 0xA52 0xA53 0xA54 0xA55 T
DB6 0x961 0x962 0x963 0x964 0x965 T
DB7 0x871 0x872 0x873 0x874 0x875 T
Table 7-61 Short Transport Test Pattern for N' = 12, F = 2, S = 8 Modes (Length = 1 Frame)
OCTET 0 1
NIBBLE 0 1 2 3
DA0 0x012 0x3
DA1 0x45 0x67
DA2 0x8 0x9AB
DA3 0xCDE 0xF
DA4 0x01 0x23
DA5 0x4 0x567
DB0 0x012 0x3
DB1 0x45 0x67
DB2 0x8 0x9AB
DB3 0xCDE 0xF
DB4 0x01 0x23
DB5 0x4 0x567
Table 7-62 Short Transport Test Pattern for N' = 12, F = 2, S = 4 Modes (Length = 1 Frame)
OCTET 0 1
NIBBLE 0 1 2 3
DA0 0x012 0x3
DA1 0x45 0x67
DA2 0x8 0x9AB
DB0 0x012 0x3
DB1 0x45 0x67
DB2 0x8 0x9AB