SLUSAD3C June   2011  – October 2016

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Pin Configuration and Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Characteristics - AC SPI Data Interface
    7. 6.7 Vertical Communications Bus
    8. 6.8 Typical Characteristics
  7. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Analog-to-Digital Conversion (ADC)
        1. 7.3.1.1  General Features
        2. 7.3.1.2  3-to-6 Series Cell Configuration
        3. 7.3.1.3  Cell Voltage Measurements
        4. 7.3.1.4  GPAI or VBAT Measurements
          1. 7.3.1.4.1 Converting GPAI Result to Voltage
          2. 7.3.1.4.2 Converting VBAT Result to Voltage
        5. 7.3.1.5  Temperature Measurement
          1. 7.3.1.5.1 External Temperature Sensor Support (TS1+, TS1-, TS2+, and TS2-)
          2. 7.3.1.5.2 Converting TSn Result to Voltage (Ratio)
        6. 7.3.1.6  ADC Band-Gap Voltage Reference
        7. 7.3.1.7  Conversion Control
          1. 7.3.1.7.1 Convert Start
            1. 7.3.1.7.1.1 Hardware Start
            2. 7.3.1.7.1.2 Firmware Start
          2. 7.3.1.7.2 Data Ready
          3. 7.3.1.7.3 ADC Channel Selection
          4. 7.3.1.7.4 Conversion Time Control
          5. 7.3.1.7.5 Automatic Versus Manual Control
        8. 7.3.1.8  Secondary Protection
          1. 7.3.1.8.1 Protector Functionality
            1. 7.3.1.8.1.1 Using the Protector Functions With 3-5 Cells
        9. 7.3.1.9  Cell Overvoltage Fault Detection (COV)
        10. 7.3.1.10 Cell Undervoltage Fault Detection (CUV)
        11. 7.3.1.11 Overtemperature Detection
          1. 7.3.1.11.1 Ratiometric Sensing
          2. 7.3.1.11.2 Thermistor Power
          3. 7.3.1.11.3 Thermistor Input Conditioning
        12. 7.3.1.12 Fault and Alert Behavior
          1. 7.3.1.12.1 Fault Recovery Procedure
        13. 7.3.1.13 Secondary Protector Built-In Self-Test Features
      2. 7.3.2 Cell Balancing
        1. 7.3.2.1 Cell Balance Control Safety Timer
      3. 7.3.3 Other Features and Functions
        1. 7.3.3.1 Internal Voltage Regulators
          1. 7.3.3.1.1 Internal 5-V Analog Supply
          2. 7.3.3.1.2 Internal 5-V Digital Supply
          3. 7.3.3.1.3 Low-Dropout Regulator (REG50)
          4. 7.3.3.1.4 Auxiliary Power Output (AUX)
        2. 7.3.3.2 Undervoltage Lockout and Power-On Reset
          1. 7.3.3.2.1 UVLO
          2. 7.3.3.2.2 Power-On Reset (POR)
          3. 7.3.3.2.3 Reset Command
        3. 7.3.3.3 Thermal Shutdown (TSD)
        4. 7.3.3.4 GPIO
      4. 7.3.4 Communications
        1. 7.3.4.1 SPI Communications - Device to Host
      5. 7.3.5 Device-to-Device Vertical Bus (VBUS) Interface
      6. 7.3.6 Packet Formats
        1. 7.3.6.1 Data Read Packet
        2. 7.3.6.2 Data Write Packet
        3. 7.3.6.3 Broadcast Writes
        4. 7.3.6.4 Communications Packet Structure
        5. 7.3.6.5 CRC Algorithm
        6. 7.3.6.6 Data Packet Usage Examples
      7. 7.3.7 Device Addressing
      8. 7.3.8 Changes and Enhancements for bq76PL536A
    4. 7.4 Device Functional Modes
      1. 7.4.1 SLEEP Functionality
        1. 7.4.1.1 SLEEP State Entry (Bit Set)
        2. 7.4.1.2 Sleep State Exit (Bit Reset)
    5. 7.5 Programming
      1. 7.5.1 Programming the EPROM Configuration Registers
    6. 7.6 Register Maps
      1. 7.6.1  I/O Register Details
      2. 7.6.2  Register Types
        1. 7.6.2.1 Read-Only (Group 1)
        2. 7.6.2.2 Read / Write (Group 2)
        3. 7.6.2.3 Read / Write, Initialized From EPROM (Group3)
        4. 7.6.2.4 Error Checking and Correcting (ECC) EPROM
      3. 7.6.3  Register Details
        1. 7.6.3.1 DEVICE_STATUS Register (0x00)
      4. 7.6.4  GPAI (0x01, 0x02) Register
      5. 7.6.5  VCELLn Register (0x03…0x0e)
      6. 7.6.6  TEMPERATURE1 Register (0x0f, 0x10)
      7. 7.6.7  TEMPERATURE2 Register (0x11, 0x12)
      8. 7.6.8  ALERT_STATUS Register (0x20)
      9. 7.6.9  FAULT_STATUS Register (0x21)
      10. 7.6.10 COV_FAULT Register (0x22)
      11. 7.6.11 CUV_FAULT Register (0x23)
      12. 7.6.12 PARITY_H Register (0x24) (PRESULT_A (R/O))
      13. 7.6.13 PARITY_H Register (0x25) (PRESULT_B (R/O))
      14. 7.6.14 ADC_CONTROL Register (0x30)
      15. 7.6.15 IO_CONTROL Register (0x31)
      16. 7.6.16 CB_CTRL Register (0x32)
      17. 7.6.17 CB_TIME Register (0x33)
      18. 7.6.18 ADC_CONVERT Register (0x34)
      19. 7.6.19 SHDW_CTRL Register (0x3a)
      20. 7.6.20 ADDRESS_CONTROL Register (0x3b)
      21. 7.6.21 RESET Register (0x3c)
      22. 7.6.22 TEST_SELECT Register (0x3d)
      23. 7.6.23 E_EN Register (0x3f)
      24. 7.6.24 FUNCTION_CONFIG Register (0x40)
      25. 7.6.25 IO_CONFIG Register (0x41)
      26. 7.6.26 CONFIG_COV Register (0x42)
      27. 7.6.27 CONFIG_COVT Register (0x43)
      28. 7.6.28 CONFIG_UV Register (0x44)
      29. 7.6.29 CONFIG_CUVT Register (0x45)
      30. 7.6.30 CONFIG_OT Register (0x46)
      31. 7.6.31 CONFIG_OTT Register (0x47)
      32. 7.6.32 USERx Register (0x48-0x4b) (USER1-4)
  8. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Anti-Aliasing Filter
      2. 8.1.2 Host SPI Interface Pin States
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
    3. 8.3 Other Schematics
  9. Power Supply Recommendations
    1. 9.1 Power Supply Decoupling
  10. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  11. 11Device and Documentation Support
    1. 11.1 Receiving Notification of Documentation Updates
    2. 11.2 Community Resources
    3. 11.3 Trademarks
    4. 11.4 Electrostatic Discharge Caution
    5. 11.5 Glossary
  12. 12Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Revision History

Changes from B Revision (January 2016) to C Revision

  • Changed condition statement from "VBAT = 20 V" to "VBAT = 22 V" in Recommended Operating Conditions, Electrical Characteristics and , Timing Characteristics – AC SPI Data Interface tablesGo
  • Changed condition statement from "VBAT = 7.2 V to 30 V" to "VBAT = 7.2 V to 27 V" in Recommended Operating ConditionsGo
  • Added Receiving Notification of Documentation Updates sectionGo

Changes from A Revision (August 2012) to B Revision

  • Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section. Go
  • Changed description to be more concise Go
  • Listed values and removed VCn to VCn-1 row Go
  • Changed top two labels with bottom two labels for this rowGo
  • Deleted FUNCTION_CONFG[ADCTx]=00 and table note: "ADC specifications valid when device is programmed for 6-µs conversion time per channel, FUNC_CONFIG[ADCT1:0] = 01b" from ADC COMMON SPECIFICATIONS in Eletrical Characteristics sectionGo
  • Deleted table note: "ADC is factory trimmed at the conversion speed of ~6 µs/channel (FUNC_CONFIG[ADCT1:0] = 01b). Use of a different conversion-speed setting may affect measurement accuracy" from Cn (CELL) INPUTS in Eletrical Characteristics sectionGo
  • Changed title to DELAY TIMESGo
  • Changed units in equations to match unit in corresponding row Go
  • Changed name from VC0 to VSS Go
  • Added CONV_H pin is not usedGo
  • Added TNOM table note Go
  • Changed warning to caution Go
  • Changed text to warning Go
  • Changed text to caution and added SLEEP State in textGo
  • Changed TS1(2) to TS1:TS2 throughout documentGo
  • Deleted ADC Conversion Timing tableGo
  • Changed anti-aliasing filter for VC6–VC1Go
  • Changed note wording for LDODxGo

Changes from * Revision (June 2011) to A Revision

  • Changed the pinout image to remove the device number and package typeGo