SNAS682 March 2016 CDCM6208V2G
PRODUCTION DATA.
This section describes the characterization test setup of each block in the CDCM6208V2G.
Figure 8. LVCMOS Output AC Configuration During Device Test (VOH, VOL, tSLEW)
Figure 9. LVCMOS Output DC Configuration During Device Test
Figure 10. LVCMOS Output AC Configuration During Device Phase Noise Test
Figure 11. LVDS, CML, and LVPECL Output AC Configuration During Device Test
Figure 12. HCSL Output DC Configuration During Device Test
Figure 13. HCSL Output AC Configuration During Device Test
Figure 14. LVCMOS Input DC Configuration During Device Test
Figure 15. CML Input DC Configuration During Device Test
Figure 16. LVDS Input DC Configuration During Device Test
Figure 17. LVPECL Input DC Configuration During Device Test
Figure 18. Differential Input AC Configuration During Device Test
Figure 19. Crystal Reference Input Configuration During Device Test
Figure 20. Jitter transfer Test Setup
Figure 21. PSNR Test Setup
Figure 22. Differential Output Voltage and Rise and Fall Time
Figure 23. Single Ended Output Voltage and Rise and Fall Time
Figure 24. Differential and Single Ended Output Skew and Propagation Delay