SBAS538D December   2013  – December 2021 DAC7750 , DAC8750

PRODUCTION DATA  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
  4. 4 Revision History
  5. 5 Device Comparison Table
  6. 6 Pin Configuration and Functions
  7. 7 Specifications
    1. 7.1  Absolute Maximum Ratings
    2. 7.2  ESD Ratings
    3. 7.3  Recommended Operating Conditions
    4. 7.4  Thermal Information
    5. 7.5  Electrical Characteristics
    6. 7.6  Electrical Characteristics: AC
    7. 7.7  Timing Requirements: Write Mode
    8. 7.8  Timing Requirements: Readback Mode
    9. 7.9  Timing Diagrams
    10. 7.10 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1  DAC Architecture
      2. 8.3.2  Current Output Stage
      3. 8.3.3  Internal Reference
      4. 8.3.4  Digital Power Supply
      5. 8.3.5  DAC Clear
      6. 8.3.6  Power-On Reset
      7. 8.3.7  Alarm Detection
      8. 8.3.8  Watchdog Timer
      9. 8.3.9  Frame Error Checking
      10. 8.3.10 User Calibration
      11. 8.3.11 Programmable Slew Rate
    4. 8.4 Device Functional Modes
      1. 8.4.1 Setting Current-Output Ranges
      2. 8.4.2 Current-Setting Resistor
      3. 8.4.3 BOOST Configuration for IOUT
      4. 8.4.4 Filtering The Current Output
      5. 8.4.5 Output Current Monitoring
      6. 8.4.6 HART Interface
        1. 8.4.6.1 Implementing HART in 4-mA to 20-mA Mode
        2. 8.4.6.2 Implementing HART in All Current Output Modes
    5. 8.5 Programming
      1. 8.5.1 Serial Peripheral Interface (SPI)
        1. 8.5.1.1 SPI Shift Register
        2. 8.5.1.2 Write Operation
        3. 8.5.1.3 Read Operation
        4. 8.5.1.4 Stand-Alone Operation
        5. 8.5.1.5 Multiple Devices on the Bus
    6. 8.6 Register Maps
      1. 8.6.1 DACx750 Register Descriptions
        1. 8.6.1.1 Control Register
        2. 8.6.1.2 Configuration Register
        3. 8.6.1.3 DAC Registers
        4. 8.6.1.4 Reset Register
        5. 8.6.1.5 Status Register
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 HART Implementation
        1. 9.1.1.1 Using the CAP2 Pin
        2. 9.1.1.2 Using the ISET-R Pin
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curve
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 Thermal Considerations
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Support Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

11.1 Layout Guidelines

To maximize the performance of the DACx750 in any application, good layout practices and proper circuit design must be followed. A few recommendations specific to the DACx750 are:

  • As illustrated in Figure 9-1, CAP2 is directly connected to the input of the final IOUT amplifier. Any noise or unwanted ac signal routed near the CAP1 and CAP2 pins could capacitively couple onto internal nodes and affect IOUT. Therefore, make sure to avoid routing any digital or HART signal traces over the CAP1 and CAP2 traces.
  • Connect the thermal PAD to the lowest potential in the system.
  • Make sure that AVDD has decoupling capacitors local to the respective pins.
  • Place the reference capacitor close to the reference input pin.
  • Avoid routing switching signals near the reference input.
  • For designs that include protection circuits:
    • Place diversion elements, such as TVS diodes or capacitors, close to off-board connectors to make sure that return current from high-energy transients does not cause damage to sensitive devices.
    • Use large, wide traces to provide a low-impedance path to divert high-energy transients away from I/O pins.