SLVSJO5 August   2025 SN74AHCT541-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Switching Characteristics
    7. 5.7 Noise Characteristics
    8. 5.8 Typical Characteristics
  7. 6 Parameter Measurement Information
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Balanced CMOS 3-State Outputs
      2. 7.3.2 TTL-Compatible CMOS Inputs
      3. 7.3.3 Wettable Flanks
      4. 7.3.4 Clamp Diode Structure
    4. 7.4 Device Functional Modes
  9. 8 Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Typical Application
        1. 8.1.1.1 Design Requirements
          1. 8.1.1.1.1 Power Considerations
          2. 8.1.1.1.2 Input Considerations
          3. 8.1.1.1.3 Output Considerations
        2. 8.1.1.2 Detailed Design Procedure
        3. 8.1.1.3 Application Curves
    2. 8.2 Power Supply Recommendations
    3. 8.3 Layout
      1. 8.3.1 Layout Guidelines
      2. 8.3.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

6 Parameter Measurement Information

Phase relationships between waveforms were chosen arbitrarily for the examples listed in the following table. All input pulses are supplied by generators having the following characteristics: PRR ≤ 1MHz, ZO = 50Ω, tt < 2.5ns.

The outputs are measured individually with one input transition per measurement.

TEST S1 S2 RL CL ΔV VCC
tPLH, tPHL OPEN OPEN — 15pF, 50pF — ALL
tPLZ, tPZL CLOSED OPEN 1 kΩ 15pF, 50pF 0.15V ≤ 2.5V
tPHZ, tPZH OPEN CLOSED 1 kΩ 15pF, 50pF 0.15V ≤ 2.5V
tPLZ, tPZL CLOSED OPEN 1 kΩ 15pF, 50pF 0.3V > 2.5V
tPHZ, tPZH OPEN CLOSED 1 kΩ 15pF, 50pF 0.3V > 2.5V

SN74AHCT541-Q1 Load Circuit for 3-State Outputs
(1) CL includes probe and test-fixture capacitance.
Figure 6-1 Load Circuit for 3-State Outputs
SN74AHCT541-Q1 Voltage Waveforms Propagation Delays
(1) The greater between tPZL and tPZH is the same as ten.
(2) The greater between tPLZ and tPHZ is the same as tdis.
Figure 6-3 Voltage Waveforms Propagation Delays
SN74AHCT541-Q1 Voltage Waveforms, Noise
Noise values measured with all other outputs simultaneously switching.
Figure 6-5 Voltage Waveforms, Noise
SN74AHCT541-Q1 Voltage Waveforms Propagation Delays
(1) The greater between tPLH and tPHL is the same as tpd.
Figure 6-2 Voltage Waveforms Propagation Delays
SN74AHCT541-Q1 Voltage Waveforms, Input and Output Transition Times
(1) The greater between tr and tf is the same as tt.
Figure 6-4 Voltage Waveforms, Input and Output Transition Times