SNVSCH9 April   2025 TPS388C0-Q1

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Device Comparison
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Typical Characteristics
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Device Functional Modes
      1. 7.3.1 TPS388C0x-Q1 Power ON
      2. 7.3.2 Built-In Self Test and Configuration Load
        1. 7.3.2.1 Notes on BIST Execution
      3. 7.3.3 General Monitoring
        1. 7.3.3.1 ACTIVE Monitoring
    4. 7.4 Feature Description
      1. 7.4.1 VDD
      2. 7.4.2 Maskable Interrupt (AMSK)
      3. 7.4.3 MON
      4. 7.4.4 NRST
      5. 7.4.5 NIRQ
      6. 7.4.6 I2C
      7. 7.4.7 Packet Error Checking (PEC)
      8. 7.4.8 Window Watchdog
      9. 7.4.9 Window Watchdog Timer
    5. 7.5 Register Maps
      1. 7.5.1 Registers Overview
        1. 7.5.1.1 BANK0 Registers
        2. 7.5.1.2 BANK1 Registers
  9. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Automotive Multichannel Sequencer and Monitor
      2. 8.2.2 Design Requirements
      3. 8.2.3 Detailed Design Procedure
      4. 8.2.4 Application Curves
    3. 8.3 Power Supply Recommendations
      1. 8.3.1 Power Supply Guidelines
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. Device and Documentation Support
    1. 9.1 Device Nomenclature
    2. 9.2 Documentation Support
    3. 9.3 Receiving Notification of Documentation Updates
    4. 9.4 Support Resources
    5. 9.5 Trademarks
    6. 9.6 Electrostatic Discharge Caution
    7. 9.7 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Package Options

Mechanical Data (Package|Pins)
Thermal pad, mechanical data (Package|Pins)
Orderable Information

Electrostatic Discharge Caution

TPS388C0-Q1 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.