| THERMAL METRIC(1) |
TPS744(2) |
UNIT |
| RGW (VQFN) |
RGW (VQFN)(3) |
RGR (VQFN) |
KTW (TO-263) |
| 20 PINS |
20 PINS |
20 PINS |
7 PINS |
| RθJA |
Junction-to-ambient thermal resistance |
35.4 |
34.7 |
39.1 |
26.6 |
°C/W |
| RθJC(top) |
Junction-to-case (top) thermal resistance |
32.4 |
31 |
29.3 |
41.7 |
°C/W |
| RθJB |
Junction-to-board thermal resistance |
14.7 |
13.5 |
10.2 |
12.5 |
°C/W |
| ψJT |
Junction-to-top characterization parameter |
0.4 |
1.4 |
0.4 |
4.0 |
°C/W |
| ψJB |
Junction-to-board characterization parameter |
14.8 |
13.5 |
10.1 |
7.3 |
°C/W |
| RθJC(bot) |
Junction-to-case (bottom) thermal resistance |
3.9 |
3.6 |
2.0 |
0.3 |
°C/W |
(2) Thermal data for the RGW, RGR, and KTW packages are derived by thermal simulations based on JEDEC-standard methodology as specified in the JESD51 series. The following assumptions are used in the simulations: (a) i. RGW and RGR: The exposed pad is connected to the PCB ground layer through a 4x4 thermal via array. - ii. KTW: The exposed pad is connected to the PCB ground layer through a 6x6 thermal via array. (b) Each of top and bottom copper layers has a dedicated pattern for 20% copper coverage. (c) These data were generated with only a single device at the center of a JEDEC high-K (2s2p) board with 3in × 3in copper area. To understand the effects of the copper area on thermal performance, refer to the Thermal Considerations section.
(3) New Chip.