JAJSE15B February   2016  – April 2018 CSD87335Q3D

PRODUCTION DATA.  

  1. 1特長
  2. 2アプリケーション
  3. 3概要
    1.     上面図
      1.      Device Images
  4. 4改訂履歴
  5. 5Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 Recommended Operating Conditions
    3. 5.3 Thermal Information
    4. 5.4 Power Block Performance
    5. 5.5 Electrical Characteristics
    6. 5.6 Typical Power Block Device Characteristics
    7. 5.7 Typical Power Block MOSFET Characteristics
  6. 6Applications and Implementation
    1. 6.1 Application Information
      1. 6.1.1 Equivalent System Performance
    2. 6.2 Power Loss Curves
    3. 6.3 Safe Operating Curves (SOA)
    4. 6.4 Normalized Curves
    5. 6.5 Calculating Power Loss and SOA
      1. 6.5.1 Design Example
      2. 6.5.2 Calculating Power Loss
      3. 6.5.3 Calculating SOA Adjustments
  7. 7Recommended PCB Design Overview
    1. 7.1 Electrical Performance
    2. 7.2 Thermal Performance
  8. 8デバイスおよびドキュメントのサポート
    1. 8.1 ドキュメントの更新通知を受け取る方法
    2. 8.2 コミュニティ・リソース
    3. 8.3 商標
    4. 8.4 静電気放電に関する注意事項
    5. 8.5 Glossary
  9. 9メカニカル、パッケージ、および注文情報
    1. 9.1 Q3Dパッケージの寸法
    2. 9.2 推奨ランド・パターン
    3. 9.3 推奨ステンシル
    4. 9.4 Q3Dのテープ・アンド・リール情報
    5. 9.5 ピン構成

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Power Loss Curves

MOSFET centric parameters such as RDS(ON) and Qgd are needed to estimate the loss generated by the devices. In an effort to simplify the design process for engineers, Texas Instruments has provided measured power loss performance curves. Figure 1 plots the power loss of the CSD87335Q3D as a function of load current. This curve is measured by configuring and running the CSD87335Q3D as it would be in the final application (see Figure 31).The measured power loss is the CSD87335Q3D loss and consists of both input conversion loss and gate drive loss. Equation 1 is used to generate the power loss curve.

Equation 1. (VIN × IIN) + (VDD × IDD) – (VSW_AVG × IOUT) = Power loss

The power loss curve in Figure 1 is measured at the maximum recommended junction temperatures of 125°C under isothermal test conditions.