JAJSHP7D May   2015  – July 2019 DRV8305-Q1

PRODUCTION DATA.  

  1. 特長
  2. アプリケーション
  3. 概要
    1.     Device Images
      1.      概略回路図
  4. 改訂履歴
  5. 概要(続き)
  6. Pin Configuration and Functions
    1.     Pin Functions
  7. Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 SPI Timing Requirements (Slave Mode Only)
    7. 7.7 Typical Characteristics
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Integrated Three-Phase Gate Driver
      2. 8.3.2 INHx/INLx: Gate Driver Input Modes
      3. 8.3.3 VCPH Charge Pump: High-Side Gate Supply
      4. 8.3.4 VCP_LSD LDO: Low-Side Gate Supply
      5. 8.3.5 GHx/GLx: Half-Bridge Gate Drivers
        1. 8.3.5.1 Smart Gate Drive Architecture: IDRIVE
        2. 8.3.5.2 Smart Gate Drive Architecture: TDRIVE
        3. 8.3.5.3 CSAs: Current Shunt Amplifiers
      6. 8.3.6 DVDD and AVDD: Internal Voltage Regulators
      7. 8.3.7 VREG: Voltage Regulator Output
      8. 8.3.8 Protection Features
        1. 8.3.8.1 Fault and Warning Classification
        2. 8.3.8.2 MOSFET Shoot-Through Protection (TDRIVE)
        3. 8.3.8.3 MOSFET Overcurrent Protection (VDS_OCP)
          1. 8.3.8.3.1 MOSFET dV/dt Turn On Protection (TDRIVE)
          2. 8.3.8.3.2 MOSFET Gate Drive Protection (GDF)
        4. 8.3.8.4 Low-Side Source Monitors (SNS_OCP)
        5. 8.3.8.5 Fault and Warning Operating Modes
      9. 8.3.9 Undervoltage Warning (UVFL), Undervoltage Lockout (UVLO), and Overvoltage (OV) Protection
        1. 8.3.9.1 Overtemperature Warning (OTW) and Shutdown (OTSD) Protection
        2. 8.3.9.2 Reverse Supply Protection
        3. 8.3.9.3 MCU Watchdog
        4. 8.3.9.4 VREG Undervoltage (VREG_UV)
        5. 8.3.9.5 Latched Fault Reset Methods
    4. 8.4 Device Functional Modes
      1. 8.4.1 Power Up Sequence
      2. 8.4.2 Standby State
      3. 8.4.3 Operating State
      4. 8.4.4 Sleep State
      5. 8.4.5 Limp Home or Fail Code Operation
    5. 8.5 Programming
      1. 8.5.1 SPI Communication
        1. 8.5.1.1 SPI
        2. 8.5.1.2 SPI Format
    6. 8.6 Register Maps
      1. 8.6.1 Status Registers
        1. 8.6.1.1 Warning and Watchdog Reset (Address = 0x1)
          1. Table 10. Warning and Watchdog Reset Register Description
        2. 8.6.1.2 OV/VDS Faults (Address = 0x2)
          1. Table 11. OV/VDS Faults Register Description
        3. 8.6.1.3 IC Faults (Address = 0x3)
          1. Table 12. IC Faults Register Description
        4. 8.6.1.4 VGS Faults (Address = 0x4)
          1. Table 13. Gate Driver VGS Faults Register Description
      2. 8.6.2 Control Registers
        1. 8.6.2.1 HS Gate Drive Control (Address = 0x5)
          1. Table 14. HS Gate Driver Control Register Description
        2. 8.6.2.2 LS Gate Drive Control (Address = 0x6)
          1. Table 15. LS Gate Driver Control Register Description
        3. 8.6.2.3 Gate Drive Control (Address = 0x7)
          1. Table 16. Gate Drive Control Register Description
        4. 8.6.2.4 IC Operation (Address = 0x9)
          1. Table 17. IC Operation Register Description
        5. 8.6.2.5 Shunt Amplifier Control (Address = 0xA)
          1. Table 18. Shunt Amplifier Control Register Description
        6. 8.6.2.6 Voltage Regulator Control (Address = 0xB)
          1. Table 19. Voltage Regulator Control Register Description
        7. 8.6.2.7 VDS Sense Control (Address = 0xC)
          1. Table 20. VDS Sense Control Register Description
  9. Application and Implementation
    1. 9.1 Application Information
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Gate Drive Average Current
        2. 9.2.2.2 MOSFET Slew Rates
        3. 9.2.2.3 Overcurrent Protection
        4. 9.2.2.4 Current Sense Amplifiers
      3. 9.2.3 VREG Reference Voltage Input (DRV8305N)
      4. 9.2.4 Application Curves
  10. 10Power Supply Recommendations
    1. 10.1 Power Supply Consideration in Generator Mode
    2. 10.2 Bulk Capacitance
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12デバイスおよびドキュメントのサポート
    1. 12.1 ドキュメントのサポート
    2. 12.2 ドキュメントの更新通知を受け取る方法
    3. 12.3 コミュニティ・リソース
    4. 12.4 商標
    5. 12.5 静電気放電に関する注意事項
    6. 12.6 Glossary
  13. 13メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Fault and Warning Classification

The DRV8305-Q1 integrates extensive error detection and monitoring features. These features allow the design of a robust system that can protect against a variety of system related failure modes. The DRV8305-Q1 classifies error events into two categories and takes different device actions dependent on the error classification.

The first error class is a Warning. There are several types of conditions that are classified as warning only. Warning errors are report only and the DRV8305-Q1 will take no other action effecting the gate drivers or other blocks. When a warning condition occurs it will be reported in the corresponding SPI status register bit and on the nFAULT pin with a repeating 56-µs pulse low followed by a 56-µs pulse high. A warning error can be cleared by an SPI read to the corresponding status register bit. The same warning will not be reported through the nFAULT pin again unless that warning or condition passes and then reoccurs.

  • A warning error is reported on the nFAULT pin with a repeating 56-µs pulse low followed by a 56-µs pulse high.
  • The warning is reported on the nFAULT pin until a SPI read to the corresponding status register.
  • The SPI read will clear the nFAULT report, but the SPI register will remain asserted until the condition has passed.
  • The nFAULT pin will report a new warning if the condition clears and then occurs again.

The second error class is a Fault. Fault errors will trigger a shutdown of the gate driver with its major blocks and are reported by holding nFAULT low with the corresponding status register asserted. Fault errors are latched until the appropriate recovery sequence is performed.

  • A fault error is reported by holding the nFAULT pin low and asserting the FAULT bit in register 0x1.
  • The error type will also be asserted in the SPI registers.
  • A fault error is a latched fault and must be cleared with the appropriate recovery sequence.
  • If a fault occurs during a warning error, the fault error will take precendence, latch nFAULT low and shutdown the gate driver.
  • The output MOSFETs will be placed into their high impedance state in a fault error event.
  • To recover from a fault type error, the condition must be removed and the CLR_FLTs bit asserted in register 0x9, bit D1 or an EN_GATE reset pulse issued.
  • The CLR_FLTS bit self clears to 0 after fault status reset and nFAULT pin is released.

There are two exceptions to the fault and warning error classes. The first exception is the temperature flag warnings (TEMP_FLAGX). A Temperature Flag warning will not trigger any action on the nFAULT pin and the corresponding status bit will be updated in real time. See the overtemperature section for additional information. The second exception is the MCU Watchdog and VREG Undervoltage (VREG_UV) faults. These are reported on the PWRGD pin to protect the system from lock out and brownout conditions. See their corresponding sections for additional information.

Note that nFAULT is an open-drain signal and must be pulled up through an external resistor.