JAJSLI4A May   2021  – December 2021 ISOW1044

PRODUCTION DATA  

  1. 特長
  2. アプリケーション
  3. 概要
  4. Revision History
  5. 概要 (続き)
  6. Device Comparison Table
  7. Pin Configuration and Functions
  8. Specifications
    1. 8.1  Absolute Maximum Ratings
    2. 8.2  ESD Ratings
    3. 8.3  Recommended Operating Conditions
    4. 8.4  ThermalInformation
    5. 8.5  Power Ratings
    6. 8.6  Insulation Specifications
    7. 8.7  Safety-Related Certifications
    8. 8.8  Safety Limiting Values
    9. 8.9  Electrical Characteristics
    10. 8.10 Supply Current Characteristics
    11. 8.11 Switching Characteristics
    12. 8.12 Insulation Characteristics Curves
    13. 8.13 Typical Characteristics
  9. Parameter Measurement Information
  10. 10Detailed Description
    1. 10.1 Overview
    2. 10.2 Power Isolation
    3. 10.3 Signal Isolation
    4. 10.4 CAN Transceiver
      1. 10.4.1 Remote Wake Request via Wake-Up Pattern (WUP) in Standby Mode
    5. 10.5 Functional Block Diagram
    6. 10.6 Feature Description
      1. 10.6.1 CAN Bus States
      2. 10.6.2 Digital Inputs and Outputs: TXD (Input) and RXD (Output)
      3. 10.6.3 TXD Dominant Timeout (DTO)
      4. 10.6.4 Power-Up and Power-Down Behavior
      5. 10.6.5 Protection Features
      6. 10.6.6 Floating Pins, Unpowered Device
      7. 10.6.7 Glitch-Free Power Up and Power Down
    7. 10.7 Device Functional Modes
    8. 10.8 Device I/O Schematics
  11. 11Application and Implementation
    1. 11.1 Application Information
    2. 11.2 Typical Application
      1. 11.2.1 Design Requirements
      2. 11.2.2 Detailed Design Procedure
        1. 11.2.2.1 Bus Loading, Length and Number of Nodes
        2. 11.2.2.2 CAN Termination
      3. 11.2.3 Application Curve
      4. 11.2.4 Insulation Lifetime
  12. 12Power Supply Recommendations
  13. 13Layout
    1. 13.1 Layout Guidelines
    2. 13.2 Layout Example
  14. 14Device and Documentation Support
    1. 14.1 Documentation Support
      1. 14.1.1 Related Documentation
    2. 14.2 Receiving Notification of Documentation Updates
    3. 14.3 サポート・リソース
    4. 14.4 Trademarks
    5. 14.5 静電気放電に関する注意事項
    6. 14.6 用語集
  15. 15Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Insulation Lifetime

Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown (TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal device and high voltage applied between the two sides; See Figure 11-5 for TDDB test setup. The insulation breakdown data is collected at various high voltages switching at 60 Hz over temperature. For reinforced insulation, VDE standard requires the use of TDDB projection line with failure rate of less than 1 part per million (ppm). Even though the expected minimum insulation lifetime is 20 years at the specified working isolation voltage, VDE reinforced certification requires additional safety margin of 20% for working voltage and 87.5% for lifetime which translates into minimum required insulation lifetime of 37.5 years at a working voltage that's 20% higher than the specified value. Figure 11-6 shows the intrinsic capability of the isolation barrier to withstand high voltage stress over its lifetime. Based on the TDDB data, the intrinsic capability of the insulation is 1000 VRMS with a lifetime of 1184 years.

GUID-5EA93C46-0CCE-439C-95F2-1A7C28A33FA3-low.gif Figure 11-5 Test Setup for Insulation Lifetime Measurement
GUID-750563EF-5F91-4922-A8EF-2731637F43D1-low.png Figure 11-6 Insulation Lifetime Projection Data