JAJS842D May   1999  – February 2024 LM7171

PRODUCTION DATA  

  1.   1
  2. 1特長
  3. 2アプリケーション
  4. 3概要
  5. 4Pin Configuration and Functions
  6. 5Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics: ±15V
    6. 5.6 Electrical Characteristics: ±5V
    7. 5.7 Typical Characteristics: LM7171A
    8. 5.8 Typical Characteristics: LM7171B
  7. 6Application and Implementation
    1. 6.1 Application Information
      1. 6.1.1 Circuit Operation
      2. 6.1.2 Slew Rate Characteristic
        1. 6.1.2.1 Slew-Rate Limitation
      3. 6.1.3 Compensation for Input Capacitance
    2. 6.2 Typical Applications
    3. 6.3 Power Supply Recommendations
      1. 6.3.1 Power-Supply Bypassing
      2. 6.3.2 Termination
      3. 6.3.3 Driving Capacitive Loads
      4. 6.3.4 Power Dissipation
    4. 6.4 Layout
      1. 6.4.1 Layout Guidelines
        1. 6.4.1.1 Printed Circuit Board and High-Speed Op Amps
        2. 6.4.1.2 Using Probes
        3. 6.4.1.3 Component Selection and Feedback Resistor
  8. 7Device and Documentation Support
    1. 7.1 ドキュメントの更新通知を受け取る方法
    2. 7.2 サポート・リソース
    3. 7.3 Trademarks
    4. 7.4 静電気放電に関する注意事項
    5. 7.5 用語集
  9. 8Revision History
  10. 9Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ（パッケージ｜ピン）
サーマルパッド・メカニカル・データ
発注情報

6.4.1.2 Using Probes

Active (FET) probes are an excellent choice for taking high-frequency measurements because of the wide bandwidth, high input impedance, and low input capacitance. However, the probe ground leads provide a long ground loop that produces errors in measurement. Instead, ground the probes directly by removing the ground leads and probe jackets and using scope probe jacks.