4 改訂履歴
Changes from B Revision (September 2016) to C Revision
- Deleted automotive (Q1) device test conditions from plots in this commercial device data sheet Go
Changes from A Revision (March 2013) to B Revision
- 「製品情報」表、「デバイスの比較」表、「ESD 定格」表、「推奨動作条件」表、「詳細説明」セクション、「アプリケーションと実装」セクション、「電源に関する推奨事項」セクション、「レイアウト」セクション、「デバイスおよびドキュメントのサポート」セクション、「メカニカル、パッケージ、および注文情報」セクションを追加Go
- Deleted Package Information table; all information now available in the package option addendum at the end of the data sheet Go
- Changed input bias current maximum value for over-temperature test condition in Electrical CharacteristicsGo
- Changed input offset current maximum value for over-temperature test condition in Electrical CharacteristicsGo
- Changed quiescent current values in Electrical CharacteristicsGo
- Changed input bias current maximum value for over-temperature test condition in Electrical CharacteristicsGo
- Changed input offset current maximum value for over-temperature test condition in Electrical CharacteristicsGo
- Changed quiescent current maximum values in Electrical CharacteristicsGo
Changes from * Revision (March 2013) to A Revision