JAJSLC2C march   2014  – march 2021 TPS3700-Q1

PRODUCTION DATA  

  1.   1
  2. 特長
  3. アプリケーション
  4. 概要
  5. Revision History
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Timing Diagram
    8. 6.8 Switching Characteristics
    9. 6.9 Typical Characteristics
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Inputs (INA+, INB–)
      2. 7.3.2 Outputs (OUTA, OUTB)
      3. 7.3.3 Window Voltage Detector
      4. 7.3.4 Immunity to Input Terminal Voltage Transients
    4. 7.4 Device Functional Modes
  9. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 VPULLUP to a Voltage Other Than VDD
      2. 8.1.2 Monitoring VDD
      3. 8.1.3 Monitoring a Voltage Other Than VDD
      4. 8.1.4 Monitoring Overvoltage and Undervoltage for Separate Rails
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
        1. 8.2.1.1 Input Supply Capacitor
        2. 8.2.1.2 Input Capacitors
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
  10. Power Supply Recommendations
  11. 10Layout
    1. 10.1 Layout Guidelines
    2. 10.2 Layout Example
  12. 11Device and Documentation Support
    1. 11.1 Documentation Support
      1. 11.1.1 Related Documentation
    2. 11.2 Trademarks
    3. 11.3 静電気放電に関する注意事項
    4. 11.4 用語集
  13. 12Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Inputs (INA+, INB–)

The TPS3700-Q1 device combines two comparators. Each comparator has one external input (inverting and noninverting); the other input is connected to the internal reference. The comparator rising threshold is designed and trimmed to be equal to the reference voltage (400 mV). Both comparators also have a built-in falling hysteresis that makes the device less sensitive to supply rail noise and ensures stable operation.

The INA+ and INB- inputs can swing from ground to 6.5 V, regardless of the device supply voltage used. Although not required in most cases, it is good analog design practice to place a 1-nF to 10-nF bypass capacitor at the comparator input for extremely noisy applications in order to reduce sensitivity to transients and layout parasitics.

For comparator A, the corresponding output (OUTA) is driven to logic low when the input INA+ voltage drops below (VIT+ – Vhys). When the voltage exceeds VIT+, the output (OUTA) goes to a high-impedance state; see Figure 6-1.

For comparator B, the corresponding output (OUTB) is driven to logic low when the voltage at input INB– exceeds VIT+. When the voltage drops below VIT+ – Vhys the output (OUTB) goes to a high-impedance state; see Figure 6-1 . Together, these comparators form a window-detection function as discussed in the Section 7.3.3 section.