SBOK078 October   2023 SN54SC4T08-SEP

PRODUCTION DATA  

  1.   1
  2.   2
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 SEL Results
    2. 5.2 Event Rate Calculations
  9. 6Summary
  10. 7References

Test Device and Test Board Information

The SN54SC4T08-SEP is a packaged 14-pin, TSSOP plastic package shown in the pinout diagram in Figure 3-1. Figure 3-2 shows the device with the package cap decapped to reveal the die for heavy ion testing.

GUID-20231005-SS0I-GDJK-CZ76-1PVCGDN2QGWQ-low.png Figure 3-1 SN54SC4T08-SEP Pinout Diagram
GUID-20231005-SS0I-FWC2-071C-FH0GQTLJL5R0-low.jpg Figure 3-2 Photo of SN54SC4T08-SEP Package Decapped

Figure 3-3 shows the evaluation board used for radiation testing. Figure 3-4 shows the bias diagram used for SEL testing.

GUID-20231005-SS0I-BVGB-Q13P-NXZG8WCPJVL0-low.jpgFigure 3-3 SN54SC4T08-SEP Evaluation Board Top View
GUID-20231005-SS0I-TRMC-BM8P-H6QNPX3B0H0G-low.pngFigure 3-4 SN54SC4T08-SEP SEL Bias Diagram
GUID-20231005-SS0I-TTVX-MZ2R-8MWD4N2WNNLP-low.jpg Figure 3-5 SN54SC4T08-SEP Thermal Image for SEL