SBOK079 October   2023 TPS7H2140-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. Introduction
  5. Single-Event Effects (SEE)
  6. Device and Test Board Information
  7. Irradiation Facility and Setup
  8. Depth, Range, and LETEFF Calculation
  9. Test Setup and Procedures
  10. Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. Single-Event Transients (SET)
  12. Event Rate Calculations
  13. 10Summary
  14. 11References

Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results

The species used for the SEL testing was a silver (109Ag) ion with an angle-of-incidence of 0° for an LETEFF = 48 MeV × cm2 / mg. For more details, see Section 5). The kinetic energy in the vacuum for this ion is 1.634 GeV (15-MeV / amu line). Flux of approximately 105 ions / cm2 × s and a fluence of approximately 107 ions / cm2 were used for the twelve runs. Run duration to achieve this fluence was approximately two minutes. The six devices were powered up using the recommended maximum voltage of 32 V and the maximum load of 5.4 A (1.35 A per channel). The device was set up with OUT1 operating in a single configuration. OUT2, OUT3, OUT4 were operated in a parallel configuration. See Figure 6-1 for more details. OUT1 was loaded to 1.35-A, while OUT2, OUT3, and OUT4 were in parallel loaded to 4.05 A(1.35 A per channel). The TPS7H2140-SEP was tested under enabled and disabled modes. The device was disabled by using an external power supply on the ENX test points. During SEB/SEGR testing with the device disabled, no OUTX transient or input current events were observed. No SEB/SEGR events were observed during all twelve runs, which indicates that the TPS7H2140-SEP is SEB/SEGR-free up to LETEFF = 48 MeV × cm2 / mg and across the full electrical specifications. Table 8-3 lists the SEB test conditions and results. Figure 7-2 and Figure 7-3 show a plot of the current versus time for run 7 (enabled) and run 8 (disabled).

Table 7-2 Summary of TPS7H2140-SEP SEB Test Condition and Results Pre-Production units refers to P-type symbolized units. Productions units refers to units that went through the entire -SEP flow.
Run Number Type of Unit Unit Number Ion LETEFF
(MeV × cm2 / mg)
Flux
(ions × cm2/ mg)
Fluence
(Number ions)
Enabled Status
7 Preproduction 2 109Ag 48 1.14 × 105 9.97 × 106 Enabled
8 Preproduction 2 109Ag 48 1.18 × 105 1.00 × 107 Disabled
9 Preproduction 3 109Ag 48 1.01 × 105 1.00 × 107 Enabled
10 Preproduction 3 109Ag 48 8.45 × 104 1.00 × 107 Disabled
11 Preproduction 4 109Ag 48 1.03 × 105 1.00 × 107 Enabled
12 Preproduction 4 109Ag 48 1.04 × 105 1.00 × 107 Disabled
13 Production 5 109Ag 48 1.11 × 105 1.00 × 107 Enabled
14 Production 5 109Ag 48 9.96 × 104 1.00 × 107 Disabled
15 Production 6 109Ag 48 1.00 × 105 9.96 × 106 Enabled
16 Production 6 109Ag 48 1.00 × 105 1.00 × 107 Disabled
17 Production 7 109Ag 48 1.00 × 105 1.00 × 107 Enabled
18 Production 7 109Ag 48 1.00 × 105 1.00 × 107 Disabled

Using the MFTF method shown in Single-Event Effects (SEE) Confidence Interval Calculations and combining (or summing) the fluences of the twelve runs at 25°C (11.93 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:

σ S E B     3.09   ×   10 - 8   c m 2   /   d e v i c e   f o r   L E T E F F   =   48   M e V   ×   c m 2 / m g   a n d   T J   =   25 ° C

GUID-20230913-SS0I-QBZK-F8XF-MFXDK1Q34LCM-low.svgFigure 7-2 IIN versus Time for Run 7 (Enabled) for the TPS7H2140-SEP
GUID-20230913-SS0I-FGGL-HQS5-TH0NJGVJG5WG-low.svgFigure 7-3 IIN versus Time for Run 8 (Disabled) for the TPS7H2140-SEP