SFFS624 March   2024 MSPM0G3105 , MSPM0G3106 , MSPM0G3107 , MSPM0G3107-Q1 , MSPM0G3505 , MSPM0G3506 , MSPM0G3507 , MSPM0G3507-Q1

 

  1.   1
  2. 1Introduction
    1.     Trademarks
  3. 2 MSPM0G Hardware Component Functional Safety Capability
  4. 3Development Process for Management of Systematic Faults
    1. 3.1 TI New-Product Development Process
    2. 3.2 TI Functional Safety Development Process
  5. 4 MSPM0G Component Overview
    1. 4.1 Targeted Applications
    2. 4.2 Hardware Component Functional Safety Concept
    3. 4.3 Functional Safety Constraints and Assumptions
  6. 5Description of Hardware Component Parts
    1. 5.1  ADC
    2. 5.2  Comparator
    3. 5.3  DAC
    4. 5.4  OPA
    5. 5.5  CPU
    6. 5.6  RAM
    7. 5.7  FLASH
    8. 5.8  GPIO
    9. 5.9  DMA
    10. 5.10 SPI
    11. 5.11 I2C
    12. 5.12 UART
    13. 5.13 Timers (TIMx)
    14. 5.14 Power Management Unit (PMU)
    15. 5.15 Clock Module (CKM)
    16. 5.16 CAN-FD
  7. 6 MSPM0G Management of Random Faults
    1. 6.1 Fault Reporting
    2. 6.2 Functional Safety Mechanism Categories
    3. 6.3 Description of Functional Safety Mechanisms
      1. 6.3.1  ADC1,COMP1,DAC1,DMA1,GPIO2,TIM2,I2C2,IOMUX1,OA1,SPI2,UART2,SYSCTL5,MCAN2: Periodic read of static configuration registers
      2. 6.3.2  ADC2: Software test of function
      3. 6.3.3  ADC3: ADC trigger overflow check
      4. 6.3.4  ADC4: Window comparator
      5. 6.3.5  OA2: Test of OA using internal DAC as a driver
      6. 6.3.6  COMP2: Software test of Comparator using internal DAC
      7. 6.3.7  WDT: Windowed watch dog timer
      8. 6.3.8  CPU1: CPU test using software test library
      9. 6.3.9  CPU2: Software test of CPU data busses
      10. 6.3.10 SYSMEM4: Parity protection on SRAM
      11. 6.3.11 FLASH1: Flash Single Error Correction, Double Error Detection mechanism
      12. 6.3.12 DAC2: DAC test using internal ADC as DAC output checker
      13. 6.3.13 DAC3: DAC FIFO underrun interrupt
      14. 6.3.14 DMA2: Software test of DMA function
      15. 6.3.15 GPIO1: GPIO test using pin IO loopback
      16. 6.3.16 TIM1: Test for PWM generation
      17. 6.3.17 I2C1: Software test of I2C function using internal loopback mechanism
      18. 6.3.18 SPI1 : Software test of SPI function
      19. 6.3.19 SPI3: SPI periodic safety message exchange
      20. 6.3.20 UART1: Software test of UART function
      21. 6.3.21 SYSCTL1: MCLK monitor
      22. 6.3.22 SYSCTL2: HFCLK startup monitor
      23. 6.3.23 SYSCTL3: LFCLK monitor
      24. 6.3.24 SYSCTL4: RTC monitor
      25. 6.3.25 SYSCTL6: SYSPLL startup monitor
      26. 6.3.26 SYSCTL8: Brownout Reset (BOR) Supervisor
      27. 6.3.27 SYSCTL9: FCC counter logic to calculate clock frequencies
      28. 6.3.28 SYSCTL10: External voltage monitor
      29. 6.3.29 SYSCTL11: Boot process monitor
      30. 6.3.30 SYSCTL12: TRIM bits parity protection
      31. 6.3.31 SYSCTL14: Brownout Voltage Monitor
      32. 6.3.32 SYSCTL15: External voltage monitor
      33. 6.3.33 MCAN1: Software test of function using I/O Loopback
      34. 6.3.34 MCAN4: SRAM ECC
      35. 6.3.35 MCAN5: Software test of ECC check logic
      36. 6.3.36 MCAN6: MCAN timeout function
      37. 6.3.37 MCAN7: MCAN timestamp function
  8. 7An In-Context Look at This Safety Element out of Context
    1. 7.1 System Functional Safety Concept Examples
  9.   A Summary of Recommended Functional Safety Mechanism Usage (Optional)
  10.   B Distributed Developments
    1.     B.1 How the Functional Safety Lifecycle Applies to TI Functional Safety Products
    2.     B.2 Activities Performed by Texas Instruments
    3.     B.3 Information Provided

Timers (TIMx)

The timer peripherals in these devices support the following key features, for specific configuration see Table 5-2:

Specific features for the general-purpose timer (TIMGx) include:

  • 16-bit up, down, up-down or down-up counter, with repeat-reload mode
  • 32-bit up, down, up-down or down-up counter, with repeat-reload mode
  • Selectable and configurable clock source
  • 8-bit programmable prescaler to divide the counter clock frequency
  • Two independent channels for
    • Output compare
    • Input capture
    • PWM output
    • One-shot mode
  • Support quadrature encoder interface (QEI) for positioning and movement sensing
  • Support synchronization and cross trigger among different TIMx instances in the same power domain
  • Support interrupt/DMA trigger generation and cross peripherals (such as ADC) trigger capability
  • Cross trigger event logic for Hall sensor inputs

Specific features for the advanced timer (TIMAx) include:

  • 16-bit down or up-down counter, with repeat-reload mode
  • Selectable and configurable clock source
  • 8-bit programmable prescaler to divide the counter clock frequency
  • Repeat counter to generate an interrupt or event only after a given number of cycles of the counter
  • Up to four independent channels for
    • Output compare
    • Input capture
    • PWM output
    • One-shot mode
  • Shadow register for load and CC register
  • Complementary output PWM
  • Asymmetric PWM with programmable dead band insertion
  • Fault handling mechanism to ensure the output signals in a safe user-defined state when a fault condition is encountered
  • Support synchronization and cross trigger among different TIMx instances in the same power domain
  • Support interrupt and DMA trigger generation and cross peripherals (such as ADC) trigger capability
  • Two additional capture/compare channels for internal events
Table 5-2 TIMx Configurations
TIMER NAME POWER DOMAIN RESOLUTION PRESCALER REPEAT COUNTER CAPTURE / COMPARE CHANNELS PHASE LOAD SHADOW LOAD SHADOW CC DEADBAND FAULT QEI
TIMG0 PD0 16-bit 8-bit 2
TIMG6 PD1 16-bit 8-bit 2
TIMG7 PD1 16-bit 8-bit 2 Yes Yes
TIMG8 PD0 16-bit 8-bit 2 Yes
TIMG12 PD1 32-bit 2 Yes
TIMA0 PD1 16-bit 8-bit 8-bit 4 Yes Yes Yes Yes Yes
TIMA1 PD1 16-bit 8-bit 8-bit 2 Yes Yes Yes Yes Yes

For more details, see the TIMx chapter of the MSPM0 G-Series 80-MHz Microcontrollers Technical Reference Manual.

The following tests can be applied as functional safety mechanisms for this module (to provide diagnostic coverage on a specific function):