SLVK153 November   2023 TPS7H1111-SP

 

  1.   1
  2.   TPS7H1111-QMLP Total Ionizing Dose (TID)
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Facility
    3. 2.3 Test Setup Details
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Data Sheet Electrical Parameters and Associated Tests
  7. 4Applicable and Reference Documents
    1. 4.1 Applicable Documents
    2. 4.2 Reference Documents
  8.   A Appendix: HDR TID Report Data

2.4 Test Configuration and Condition

HDR devices were stressed at 3 krad(Si), 10 krad(Si), 30 krad(Si), 50 krad(Si), and 100 krad(Si) for biased and unbiased conditions.

Table 2-1 HDR ≥ 50–300 rad(Si)/s Biased Device Information (HDR)
Total Samples: 25
Exposure Levels:
3 krad(Si) (5 samples) 10 krad(Si) (5 samples) 30 krad(Si) (5 samples) 50 krad(Si) (5 samples) 100 krad(Si) (5 samples)
Device IDs: 1-5 Device IDs: 6-10 Device IDs: 15-19 Device IDs: 11-14, 20 Device IDs: 21-25
Table 2-2 HDR ≥ 50–300 rad(Si)/s Unbiased Device Information (HDR)
Total Samples: 25
Exposure Levels:
3 krad(Si) (5 samples) 10 krad(Si) (5 samples) 30 krad(Si) (5 samples) 50 krad(Si) (5 samples) 100 krad(Si) (5 samples)
Device IDs: 26-30 Device IDs: 31-35 Device IDs: 36-40 Device IDs: 41-45 Device IDs: 46-50