SLVZ025 March   2022 LP8764-Q1


  1. 1Usage Notes and Advisories Matrices
    1. 1.1 Usage Notes Matrix
    2. 1.2 Advisories Matrix
  2. 2Nomenclature, Package Symbolization, and Revision Identification
    1. 2.1 Device and Development-Support Tool Nomenclature
    2. 2.2 Devices Supported
    3. 2.3 Package Symbolization and Revision Identification
  3. 3Silicon Revision 2.0 Usage Notes and Advisories
  4. 4Silicon Revision 2.0 Usage Notes
  5. 5Silicon Revision 2.0 Advisories
    1. 5.1 Advisories
  6. 6Trademarks

Device and Development-Support Tool Nomenclature

To designate the stages in the product development cycle, TI assigns prefixes to the part numbers. Each device has one of three prefixes: X, P, or null (no prefix) (for example, P876411B4). These prefixes represent evolutionary stages of product development from engineering prototypes (P8764-Q1) through fully qualified production devices and tools (LP8764-Q1).

Device development evolutionary flow:

    X Experimental device that is not necessarily representative of the final device's electrical specifications and may not use production assembly flow.
    P Prototype device that is not necessarily the final silicon die and may not necessarily meet final electrical specifications. For LP8764-Q1 device the prototype version is indicated by removing the first "L" letter (P8764-Q1)
    null Production version of the silicon die that is fully qualified.

P8764-Q1 devices are shipped against the following disclaimer:

"Developmental product is intended for internal evaluation purposes."

Production devices have been characterized fully, and the quality and reliability of the device have been demonstrated fully. TI's standard warranty applies.

Predictions show that prototype devices (P) have a greater failure rate than the standard production devices. Texas Instruments recommends that these devices not be used in any production system because their expected end-use failure rate still is undefined. Only qualified production devices are to be used.