SBAK033 February   2025 ADC168M102R-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Single-Event Latch-Up Results
  9. 6Summary
  10. 7Confidence Interval Calculations
  11. 8References

3 Test Device and Test Board Information

The ADC168M102R-SEP is packaged in a 32-pin RHB (VQFN) shown with the pinout in Figure 3-1. Figure 3-2 shows the biasing configuration used for both the SEL and SET tests.

ADC168M102R-SEP pinout diagram. The package was decapped to reveal the die face for all heavy ion testing.

ADC168M102R-SEP Pinout Diagram Figure 3-1 ADC168M102R-SEP Pinout Diagram
ADC168M102R-SEP Bias Configuration Figure 3-2 ADC168M102R-SEP Bias Configuration