SBAS824 October   2018 ADS1235

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
    1.     Device Images
      1.      Block Diagram
      2.      ADC Conversion Noise
  4. Revision History
  5. Pin Configuration and Functions
    1.     Pin Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Switching Characteristics
    8. 6.8 Typical Characteristics
  7. Parameter Measurement Information
    1. 7.1 Noise Performance
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Analog Inputs
        1. 8.3.1.1 ESD Diodes
        2. 8.3.1.2 Input Multiplexer
        3. 8.3.1.3 Temperature Sensor
        4. 8.3.1.4 Inputs Open
        5. 8.3.1.5 Internal VCOM Connection
        6. 8.3.1.6 Alternate Functions
      2. 8.3.2 PGA
        1. 8.3.2.1 Input Voltage Range
        2. 8.3.2.2 PGA Bypass Mode
      3. 8.3.3 PGA Voltage Monitor
      4. 8.3.4 Reference Voltage
        1. 8.3.4.1 External Reference
        2. 8.3.4.2 AVDD – AVSS Reference (Default)
        3. 8.3.4.3 Reference Monitor
      5. 8.3.5 General-Purpose Input/Outputs (GPIOs)
      6. 8.3.6 Modulator
      7. 8.3.7 Digital Filter
        1. 8.3.7.1 Sinc Filter
          1. 8.3.7.1.1 Sinc Filter Frequency Response
        2. 8.3.7.2 FIR Filter
          1. 8.3.7.2.1 FIR Filter Frequency Response
        3. 8.3.7.3 Filter Bandwidth
        4. 8.3.7.4 50-Hz and 60-Hz Normal Mode Rejection
    4. 8.4 Device Functional Modes
      1. 8.4.1 Conversion Control
        1. 8.4.1.1 Continuous-Conversion Mode
        2. 8.4.1.2 Pulse-Conversion Mode
        3. 8.4.1.3 Conversion Latency
        4. 8.4.1.4 Start-Conversion Delay
      2. 8.4.2 Chop Mode
      3. 8.4.3 AC-Bridge Excitation Mode
      4. 8.4.4 ADC Clock Mode
      5. 8.4.5 Power-Down Mode
        1. 8.4.5.1 Hardware Power-Down
        2. 8.4.5.2 Software Power-Down
      6. 8.4.6 Reset
        1. 8.4.6.1 Power-on Reset
        2. 8.4.6.2 Reset by Pin
        3. 8.4.6.3 Reset by Command
      7. 8.4.7 Calibration
        1. 8.4.7.1 Offset and Full-Scale Calibration
          1. 8.4.7.1.1 Offset Calibration Registers
          2. 8.4.7.1.2 Full-Scale Calibration Registers
        2. 8.4.7.2 Offset Self-Calibration (SFOCAL)
        3. 8.4.7.3 Offset System-Calibration (SYOCAL)
        4. 8.4.7.4 Full-Scale Calibration (GANCAL)
        5. 8.4.7.5 Calibration Command Procedure
        6. 8.4.7.6 User Calibration Procedure
    5. 8.5 Programming
      1. 8.5.1 Serial Interface
        1. 8.5.1.1 Chip Select (CS)
        2. 8.5.1.2 Serial Clock (SCLK)
        3. 8.5.1.3 Data Input (DIN)
        4. 8.5.1.4 Data Output/Data Ready (DOUT/DRDY)
        5. 8.5.1.5 Serial Interface Auto-Reset
      2. 8.5.2 Data Ready (DRDY)
        1. 8.5.2.1 DRDY in Continuous-Conversion Mode
        2. 8.5.2.2 DRDY in Pulse-Conversion Mode
        3. 8.5.2.3 Data Ready by Software Polling
      3. 8.5.3 Conversion Data
        1. 8.5.3.1 Status byte (STATUS)
        2. 8.5.3.2 Conversion Data Format
      4. 8.5.4 CRC
      5. 8.5.5 Commands
        1. 8.5.5.1  NOP Command
        2. 8.5.5.2  RESET Command
        3. 8.5.5.3  START Command
        4. 8.5.5.4  STOP Command
        5. 8.5.5.5  RDATA Command
        6. 8.5.5.6  SYOCAL Command
        7. 8.5.5.7  GANCAL Command
        8. 8.5.5.8  SFOCAL Command
        9. 8.5.5.9  RREG Command
        10. 8.5.5.10 WREG Command
        11. 8.5.5.11 LOCK Command
        12. 8.5.5.12 UNLOCK Command
    6. 8.6 Register Map
      1. 8.6.1  Device Identification (ID) Register (address = 00h) [reset = Cxh]
        1. Table 28. ID Register Field Descriptions
      2. 8.6.2  Device Status (STATUS) Register (address = 01h) [reset = 01h]
        1. Table 29. STATUS Register Field Descriptions
      3. 8.6.3  Mode 0 (MODE0) Register (address = 02h) [reset = 24h]
        1. Table 30. MODE0 Register Field Descriptions
      4. 8.6.4  Mode 1 (MODE1) Register (address = 03h) [reset = 01h]
        1. Table 31. MODE1 Register Field Descriptions
      5. 8.6.5  Mode 2 (MODE2) Register (address = 04h) [reset = 00h]
        1. Table 32. MODE2 Register Field Descriptions
      6. 8.6.6  Mode 3 (MODE3) Register (address = 05h) [reset = 00h]
        1. Table 33. MODE3 Register Field Descriptions
      7. 8.6.7  Reference Configuration (REF) Register (address = 06h) [reset = 05h]
        1. Table 34. REF Register Field Descriptions
      8. 8.6.8  Offset Calibration (OFCALx) Registers (address = 07h, 08h, 09h) [reset = 00h, 00h, 00h]
        1. Table 35. OFCAL0, OFCAL1, OFCAL2 Registers Field Description
      9. 8.6.9  Full-Scale Calibration (FSCALx) Registers (address = 0Ah, 0Bh, 0Ch) [reset = 00h, 00h, 40h]
        1. Table 36. FSCAL0, FSCAL1, FSCAL2 Registers Field Description
      10. 8.6.10 Reserved (RESERVED) Register (address = 0Dh) [reset = FFh]
        1. Table 37. RESERVED Register Field Descriptions
      11. 8.6.11 Reserved (RESERVED) Register (address = 0Eh) [reset = 00h]
        1. Table 38. RESERVED Register Field Descriptions
      12. 8.6.12 Reserved (RESERVED) Register (address = 0Fh) [reset = 00h]
        1. Table 39. RESERVED Register Field Descriptions
      13. 8.6.13 PGA Configuration (PGA) Register (address = 10h) [reset = 00h]
        1. Table 40. PGA Register Field Descriptions
      14. 8.6.14 Input Multiplexer (INPMUX) Register (address = 11h) [reset = FFh]
        1. Table 41. INPMUX Register Field Descriptions
  9. Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Input Range
      2. 9.1.2 Input Overload
      3. 9.1.3 Unused Inputs and Outputs
      4. 9.1.4 Multiplexed 2-Bridge Input Example
      5. 9.1.5 AC-Bridge Excitation Example
      6. 9.1.6 Serial Interface and Digital Connections
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
      3. 9.2.3 Application Curves
    3. 9.3 Initialization Setup
  10. 10Power Supply Recommendations
    1. 10.1 Power-Supply Decoupling
    2. 10.2 Analog Power-Supply Clamp
    3. 10.3 Power-Supply Sequencing
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Community Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information

Detailed Design Procedure

A key consideration in the design of a bridge transducer for weigh applications is noise-free resolution. Noise-free resolution is defined by the ratio of full scale signal to the conversion noise of the ADC. Other considerations are data throughput rate and input signal settling time.

Table 1 shows the ADC conversion noise expressed as an input-referred quantity. The table shows various tradeoffs among gain, sample rate and sinc filter in order to optimize noise for a given design. For this example, the configuration of the ADC that yields the lowest noise while achieving the sample rate and settling time requirement is gain = 128, 10 SPS, filter order = sinc 1 and by using the chop mode. Use of the chop mode has the additional advantage of eliminating offset drift from the ADC.

Configuring the ADC for 10 SPS, the sinc4 filter order and disabling chop mode yields approximately the same noise performance compared to the target configuration (shown above) but do not satisfy the settling time requirement of 200 ms. The sinc4 filter order settles in four conversion periods, or 400 ms.

Noise-free counts are improved by increasing the signal output from the bridge. Increasing the signal output is possible by the use of a bridge with a higher gauge-factor, or by increasing the excitation voltage. Operation with an excitation voltage above 5 V requires voltage division of the bridge sense voltage before it is input to the ADC reference pins.

External filter components filter the signal and reference inputs of the ADC. The filters remove both differential and common-mode high-frequency noise. Component value mismatch in the common-mode filter converts common-mode noise into differential noise. To minimize the effect of the mismatch, the differential filter capacitor values (10 nF) are 10x higher value than the common-mode capacitors (1 nF). Increase the capacitor values to provides additional noise filtering. Maintain the resistors at low values to minimize thermal noise. For consistent noise performance, match the corner frequencies of the input and reference filters. More information is found in the RTD Ratiometric Measurements and Filtering Using the ADS1148 and ADS1248 Family of Devices Application Report.