SBOK051 November   2023 OPA4H014-SEP

PRODUCTION DATA  

  1.   1
  2.   OPA4H014-SEP Radiation Tolerant High-Speed, Quad-Channel Operational Amplifier TID Report
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Biased Device Configuration
    4. 2.4 Test Configuration and Condition
  6. 3Total Ionizing Dose Characterization Test Results
    1. 3.1 HDR Characterization Results
    2. 3.2 LDR Characterization Results
    3. 3.3 ELDRS Characterization Results
    4. 3.4 Summary of Results
  7.   A High Dose Rate Total Ionizing Dose Report
  8.   B Low Dose Rate Total Ionizing Dose Report

3.4 Summary of Results

The parametric data for the OPA4H014-SEP show the device passes up to the specified level of 30 krad(Si) under HDR. No functional failures were observed on any samples, and all tested parameters were found to remain within the limits of the production ATE test program (and thus within the data sheet limits) at 10 krad(Si), 20 krad(Si), and 30 krad(Si). An additional one-time characterization to 50 krad(Si) was performed, which showed parametric failures of the input bias current for nearly all tested device inputs, but no values greater than 16.08 pA (as compared to the specification of ±10 pA).

The parametric data for the OPA4H014-SEP show the device passes up to 30 krad(Si) under LDR. No functional failures were observed on any samples, and all tested parameters were found to remain within the limits of the production ATE test program (and as a result, within the data sheet limits) at 10 krad(Si), 20 krad(Si), and 30 krad(Si).

As the device passes up to 30 krad(Si) under both HDR and LDR conditions, and the measured post-LDR values of all parameters are below the pre-irradiation electrical specification limits at the specification dose, the OPA4H014-SEP is considered non-ELDRS to 30 krad(Si).