SBOK083A August   2024  – October 2024 TMUX582F-SEP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 Single-Event Latch-Up (SEL) Results
    2. 5.2 Event Rate Calculations
    3. 5.3 Single-Event Transients (SET) Results
  9. 6Summary
  10. 7References
  11. 8Revision History

6 Summary

The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance and single-event transients (SET) performance of the TMUX582F-SEP, latch-up immune 8:1 multiplexer with adjustable fault thresholds. Heavy-ions with an LETEFF of 43MeV-cm2/ mg were used for the SEE characterization. The SEE results demonstrated that the TMUX582F-SEP is SEL-free up to LETEFF = 43MeV × cm2 / mg and across the full electrical specifications. Transients at LETEFF = 43MeV × cm2 / mg on VOUT are presented and discussed. CREME96-based worst-week event-rate calculations for LEO (ISS) and GEO orbits for the DSEE are presented for reference.