SBOK095 December   2024 TRF0208-SP

 

  1.   1
  2.    TRF0208-SP, Near-DC to 11GHz, Fully Differential RF Amplifier Single-Event Effects (SEE) Radiation Report
  3.   Trademarks
  4. 1 Overview
  5. 2 Single-Event Effects
  6. 3 Test Device and Evaluation Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Set-Up and Procedures
  10. 7 Single-Event Latch-up (SEL) Results
  11. 8 Single-Event Transients (SET) Results
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B Confidence Interval Calculations
  16.   C References

8 Single-Event Transients (SET) Results

The TRF0208-SP was characterized for SETs from 9.62 to 81.6 MeV-cm2/mg (Table 5-1 provides more information) at 3.3V supply voltage. The device was tested at room temperature for all SETs runs. TRF0208-SP devices were thinned for proper heavy-ion penetration into the active circuits. Average flux of 105 ions/cm2-s and fluences of 107 ions/cm2 per run were used during the heavy ion characterization. The devices were tested under AC inputs. The SETs discussed on this report were defined as output voltages excursion that exceed a window trigger set on the MSO58B. Outputs of the TRF0208-SP were converted to SE using HL9402 balun and monitored. Test conditions used during the testing are provided in Table 8-1. Positive and negative upsets excursions were observed under AC test. For each upset the maximum, minimum, and transient recovery time were recorded. All upsets are recovered under 10ns. Weibull-Fit and cross section for the AC tests are shown in Figure 8-1 . The Weibull equation used for the fit is shown below, and parameters are provided in Table 8-2. To calculate the cross section values the total number of upsets (or transients) and the fluences where combined (add together) by LETEFF to calculate the upper bound cross section (as discussed in Appendix B) at 95% confidence interval. Worst case AC upset for each leg is shown in Figure 8-2. Though not observed during the testing, it is important to note that an SET event may result in output going up to saturation voltage.

Table 8-1 Summary of the TRF0208-SP AC Tests at VDD = 3.3V

Run #

Unit #

Test Type

Die-Exposed Temp. (°C)

Ion Type

LETEFF (MeV∙cm²/mg)

Average Flux (ions∙cm²/mg)

Fluence (# of ions)

Uniformity

Trigger Value

#Events

1

4

SET

25

Ho (165)

81.6

1E+05

1E+07

96

UL = +20mV

LL = –20mV

86

2

4

SET

25

Ho (165)

81.6

1E+05

1E+07

95

UL = +20mV

LL = –20mV

76

3

4

SET

25

Ho (165)

81.6

10000

1E+07

93

UL = +20mV

LL = –20mV

97

4

4

SET

25

Ho (165)

81.6

1E+05

1E+07

97

UL = +20mV

LL = –20mV

91

5

4

SET

25

Ag (109)

56.1

1E+05

1E+07

95

UL = +20mV

LL = –20mV

82

6

4

SET

25

Ag (109)

56.1

97690

9999000

96

UL = +20mV

LL = –20mV

86

7

4

SET

25

Kr (84)

35.2

1E+05

9957000

95

UL = +20mV

LL = –20mV

35

8

4

SET

25

Kr (84)

35.2

50830

9998000

95

UL = +20mV

LL = –20mV

48

9

4

SET

25

Cu (63)

24

99340

1E+07

95

UL = +20mV

LL = –20mV

10

10

4

SET

25

Cu (63)

24

50330

9880000

95

UL = +20mV

LL = –20mV

6

11

4

SET

25

Ar (40)

9.62

57140

1E+07

94

UL = +20mV

LL = –20mV

0

12

4

SET

25

Ar (40)

9.62

1E+05

1E+07

89

UL = +20mV

LL = –20mV

0

Cross Section and Weibull-Fit for the SET on OUT differentialFigure 8-1 Cross Section and Weibull-Fit for the SET on OUT differential
Equation 1. σ = σ S A T × ( 1 - e - L E T - O n s e t W s )
Table 8-2 Weibull-FIT Parameters for DC Test
ParameterValue
Onset (MeV-cm2/mg)

9.62

σSAT (cm2)

1.5× 10–5

W

40

s

1

Worst Case Upset in AC Test When Monitoring Differential Output of the TRF0208-SPFigure 8-2 Worst Case Upset in AC Test When Monitoring Differential Output of the TRF0208-SP