SBOK111 June   2025 SN55LVTA4-SEP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Bias Diagram
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Reference Documents
  8.   Appendix A: ELDRS Data
  9.   Appendix B: HDR TID Report Data
  10.   Appendix C: LDR TID Report Data

3.1 TID Characterization Summary Results

The parametric data for the SN55LVTA4-SEP passes up to 30krad(Si) HDR and LDR TID irradiation. The drifts of the electrical parameters through HDR and LDR were within the data sheet limits.

Overall, the SN55LVTA4-SEP showed a strong degree of hardness to HDR and LDR TID irradiation up to 30krad(Si). The measurements taken post-irradiation for each sample set showed a marginal shift for most parameters at each dose level. The parameters that did show a greater degree of change between pre- and post-irradiation were still within the electrical performance characteristics specified in the data sheet electrical parameters. For the data sheet electrical parameters and associated tests, see SN55LVTA4-SEP Radiation Tolerant Quad Channel High-Speed Differential Line Driver.

See Appendix B for HDR report up to 30krad(Si).

See Appendix C for LDR report up to 30krad(Si).

An ELDRS study was conducted on the HDR and LDR data and the data is provided in Appendix A of this report.