SBOSA78 March   2026 INA1H182-SEP

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Setting the Gain
        1. 6.3.1.1 Gain Drift
      2. 6.3.2 EMI Rejection
      3. 6.3.3 Input Common-Mode Range
      4. 6.3.4 Input Protection
    4. 6.4 Device Functional Modes
  8. 7 Application and Implementation
    1. 7.1 Application Information
      1. 7.1.1 Reference Pin
      2. 7.1.2 Input Bias Current Return Path
    2. 7.2 Typical Applications
      1. 7.2.1 Resistor Temperature Detector Signal Conditioning Circuit
        1. 7.2.1.1 Design Requirements
        2. 7.2.1.2 Detailed Procedure
        3. 7.2.1.3 Application Curves
    3. 7.3 Power Supply Recommendations
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
      2. 7.4.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Development Support
    2. 8.2 Documentation Support
      1. 8.2.1 Related Documentation
    3. 8.3 Receiving Notification of Documentation Updates
    4. 8.4 Support Resources
    5. 8.5 Trademarks
    6. 8.6 Electrostatic Discharge Caution
    7. 8.7 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

6.3.2 EMI Rejection

Texas Instruments developed a method to accurately measure the immunity of an amplifier over a broad frequency spectrum extending from 10MHz to 6GHz. This method uses an EMI rejection ratio (EMIRR) to quantify the ability of the INA1H182-SEP to reject EMI. The offset resulting from an input EMI signal is calculated using Equation 2:

Equation 2. ∆ V O S = V R F _ P E A K 2 100 m V P × 10 - E M I R R ( d B ) 20

where

  • VRF_PEAK is the peak amplitude of the input EMI signal.

Figure 6-2 and Figure 6-3 show the INA1H182-SEP EMIRR graph for differential and common-mode EMI rejection across this frequency range. Table 6-2 lists the EMIRR values for the INA1H182-SEP at frequencies commonly encountered in real-world applications. Applications listed in Table 6-2 are centered on or operated near the particular frequency shown. Depending on the end-system requirements, additional EMI filters can be required near the signal inputs of the system. Incorporate known good practices, such as using short traces, low-pass filters, and damping resistors combined with parallel and shielded signal routing.

INA1H182-SEP Common-Mode EMIRR Testing
Figure 6-2 Common-Mode EMIRR Testing
INA1H182-SEP Differential-Mode EMIRR Testing
Figure 6-3 Differential-Mode EMIRR Testing
Table 6-2 INA1H182-SEP EMIRR for Frequencies of Interest
FREQUENCYAPPLICATION OR ALLOCATIONDIFFERENTIAL EMIRRCOMMON-MODE EMIRR
400MHzMobile radio, mobile satellite, space operation, weather, radar, ultrahigh-frequency (UHF) applications60dB88dB
900MHzGlobal system for mobile communications (GSM) applications, radio communication, navigation, GPS (up to 1.6GHz), GSM, aeronautical mobile, UHF applications58dB60dB
1.8GHzGSM applications, mobile personal communications, broadband, satellite,
L-band (1GHz to 2GHz)		66dB89dB
2.4GHz802.11b, 802.11g, 802.11n, Bluetooth®, mobile personal communications, industrial, scientific and medical (ISM) radio band, amateur radio and satellite, S-band (2GHz to 4GHz)73dB98dB
3.6GHzRadiolocation, aero communication and navigation, satellite, mobile, S-band99dB111dB
5GHz802.11a, 802.11n, aero communication and navigation, mobile communication, space and satellite operation, C-band (4GHz to 8GHz)83dB91dB