SCES994 June 2025 TXGS441-SEP
ADVANCE INFORMATION
VID: TBD
Radiation tolerant:
Single event latch-up (SEL) immune up to 43 MeV-cm2 /mg at 125°C
Total ionizing dose (TID) Radiation Lot Acceptance Testing (RLAT) for every wafer lot up to 20 krad(Si)