SDAA385 June   2026 TCA9617B

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Failure Analysis
    1. 2.1 Original ICT Setup
    2. 2.2 Corrective Actions
    3. 2.3 Validation Result
    4. 2.4 Recommendations
  6. 3Summary
  7. 4References

Failure Analysis

Oscilloscope measurements captured significant overshoot and undershoot events during ICT operation. The worst-case overshoot measured 8.62V, while the worst-case undershoot measured -4.28V. These values exceeded the datasheet absolute maximum ratings of 6.5V and -0.5V, respectively for VIO – I2C bus voltage range. The transient spikes therefore subjected the device pins to electrical overstress conditions. See figure 2-2 note (1) of this document for overshoot behavior. See Figure 2-3 of this document for undershoot behavior.

In addition to exceeding absolute maximum VIO specifications, there exists a signal contention between the driver of the ICT and the TCA9617 B-side pedestal during a low-to-high edge transition on B-side. The pedestal behavior can be seen in the TCA9617 datasheet Figure 6-4, Figure 7-1, or Figure 8-2 point 2, and is described in Application Information.

 TCA9617B Datasheet Section 8.1
                    Application Information - Pedestal Behavior Description Figure 2-1 TCA9617B Datasheet Section 8.1 Application Information - Pedestal Behavior Description

When TCA9617 is driven from B-side to A-side, it expects an open-drain driver configuration. When the open-drain driver on B-side releases the bus, a pull-up resistor on B-side will pull-up to VCCB. During this time, the buffer will reach a voltage pedestal (~VOLB = 0.53V typical). The B-side will remain at this VOLB until the A-side surpasses a 30% of VCCA. Once this occurs, B-side is no longer held at VOLB, and is allowed to rise fully to VCCB through the pull-up resistor. If a push-pull driver is used during this edge transition from low-to-high on B-side, there will exist a contention between the pedestal voltage (VOLB) and the push-pull driver, resulting in a large amount of current sink into the buffer - see Figure 2-2 of this document.

Table 2-1 Worse Case Measurements
Parameter Measured Value Datasheet Limit
Overshoot 8.62V 6.5V
Undershoot -4.28V -0.5V
 Overshoot Spike Test from
                    ICT Figure 2-2 Overshoot Spike Test from ICT
 Undershoot Spike Test from
                    ICT Figure 2-3 Undershoot Spike Test from ICT