SFFS035A December 2020 – February 2022 LM5157-Q1 , LM51571-Q1
The failure mode distribution estimation for LM5157-Q1 and LM51571-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| SW no output | 40% |
| SW output not in specification – voltage or timing | 50% |
| SW power low-side FET stuck on | 5% |
| Power Good – False Trip or Failure to Trip | 5% |