SFFSAD4 May   2025 TLV3511-Q1 , TLV3512-Q1

 

  1.   1
  2.   Trademarks
  3. 1Overview
  4. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 SOT-23 (5) Package
    2. 2.2 SC70 (5) Package
    3. 2.3 VSSOP (8) Package
  5. 3Failure Mode Distribution (FMD)
  6. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 TLV3511-Q1 Packages
      1. 4.1.1 5-Pin Packages with OUT on Pin 1 (Northwest Pinout)
    2. 4.2 TLV3512-Q1 Packages
      1. 4.2.1 8-Pin Leaded Packages
  7. 5Revision History

5-Pin Packages with OUT on Pin 1 (Northwest Pinout)

Figure 4-1 shows the pin diagram for the TLV3511-Q1. For a detailed description of the device pins, see the Pin Configuration and Functions section in the data sheet.

TLV3511-Q1 TLV3512-Q1 TLV351x-Q1 Pin DiagramFigure 4-1 Pin Diagram
Table 4-2 Pin FMA for Device Pins Short-Circuited to Negative Supply (V-) Pin
Pin Analysis for Pin Short-Circuit to Negative Supply (V-)
Pin NamePin No.Device DamageDevice Functionality AffectedDescription of Potential Failure Effects|CommentsFailure Effect Class
OUT1PotentiallyYesThermal stress due to high power dissipationB
(V-)2NoNoNo change if same node as (V-)D
IN+3NoNoOutput goes low, if other input is positiveC
IN-4NoNoOutput goes high, if other input is positiveC
(V+)5PotentiallyYesMain supply shorted out (no power to device)B
Table 4-3 Pin FMA for Device Pins Short-Circuited to Positive Supply (V+) Pin
Pin Analysis for Pin Short-Circuit to Positive Supply (V+)
Pin NamePin No.Device DamageDevice Functionality AffectedDescription of Potential Failure Effects|CommentsFailure Effect Class
OUT1PotentiallyYesThermal stress due to high power dissipationB
(V-)2PotentiallyYesMain supply shorted out (no power to device)B
IN+3NoNoOutput goes high, if other input is less positiveC
IN-4NoNoOutput goes low, if other input is less positiveC
(V+)5NoNoNo change if same node as (V+)D
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
Pin Analysis for Pin Short-Circuit to Adjacent Pin
Pin NamePin No.Device DamageDevice Functionality AffectedDescription of Potential Failure Effects|CommentsFailure Effect Class
OUT to (V-)1 → 2PotentiallyYesThermal stress due to high power dissipationB
(V-) to IN+2 → 3NoNoOutput goes low, if other input is positiveC
IN+ to IN-3 → 4NoNoOutput is potentially low or highC
IN- to (V+)4 → 5NoNoOutput goes low, if other input is less positiveC
(V+) to OUT5 → 1PotentiallyYesThermal stress due to high power dissipationB
Table 4-5 Pin FMA for Device Pins Open-Circuited
Pin Analysis for Pin Open-Circuit
Pin NamePin No.Device DamageDevice Functionality AffectedDescription of Potential Failure Effects|CommentsFailure Effect Class
OUT1NoYesOutput cannot drive application load B
(V-)2PotentiallyYesLowest voltage pin drives GND pin internally (through a diode)B
IN+3NoNoOutput is potentially low or highC
IN-4NoNoOutput is potentially low or highC
(V+)5PotentiallyYesMain supply open (no power to device)B