SFFSAZ7 December 2025 TMP175-Q1
4 Pin Failure Mode Analysis (Pin FMA)
This section provides a failure mode analysis (FMA) for the pins of the TMP175-Q1 (SOIC-8 and VSSOP-8 packages). The failure modes covered in this document include the typical pin-by-pin failure scenarios:
- Pin short-circuited to ground (see Table 4-2)
- Pin open-circuited (see Table 4-3)
- Pin short-circuited to an adjacent pin (see Table 4-4)
- Pin short-circuited to supply (see Table 4-5)
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Table 4-1 TI Classification of Failure Effects
| Class | Failure Effects |
|---|---|
| A | Potential device damage that affects functionality. |
| B | No device damage, but loss of functionality. |
| C | No device damage, but performance degradation. |
| D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the TMP175-Q1 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the TMP175-Q1 datasheet.
Figure 4-1 Pin DiagramFollowing are the assumptions of use and the device configuration assumed for the pin FMA in this section:
- A bypass capacitor of 0.1μF on the input voltage pin is implemented.
Table 4-2 Pin FMA for Device Pins Short-Circuited to Ground
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| SDA | 1 | The SDA pin is stuck low. I2C communication is not possible. | B |
| SCL | 2 | The SCL pin is stuck low. I2C communication is not possible. | B |
| ALERT | 3 | The ALERT pin is stuck low. The functionality of the ALERT pin is not available. | B |
| GND | 4 | There is no effect on the device. The device operates as normal. | D |
| A2 | 5 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| A1 | 6 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| A0 | 7 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| V+ | 8 | The device is not functional and potentially damaged. | A |
Table 4-3 Pin FMA for Device Pins Open-Circuited
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| SDA | 1 | The state of the SDA pin is undetermined. I2C communication is not possible. | B |
| SCL | 2 | The state of the SDA pin is undetermined. I2C communication is not possible. | B |
| ALERT | 3 | The functionality of the ALERT pin is not available. | B |
| GND | 4 | The functionality of the device is undetermined. | B |
| A2 | 5 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| A1 | 6 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| A0 | 7 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| V+ | 8 | The functionality of the device is undetermined. | B |
Table 4-4 Pin FMA for Device Pins Short-Circuited to Adjacent Pin
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|---|
| SDA | 1 | SCL | I2C communication is not possible. | B |
| SCL | 2 | ALERT | The functionality of the ALERT pin is not available. | B |
| ALERT | 3 | GND | The ALERT pin is stuck low. The functionality of the ALERT pin is not available. | B |
| GND | 4 | A2 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| A2 | 5 | A1 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| A1 | 6 | A0 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| A0 | 7 | V+ | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| V+ | 8 | SDA | The SDA pin is stuck high. I2C communication is not possible. | B |
Table 4-5 Pin FMA for Device Pins Short-Circuited to Supply
| Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
|---|---|---|---|
| SDA | 1 | The SDA pin is stuck high. I2C communication is not possible. | B |
| SCL | 2 | The SCL pin is stuck high. I2C communication is not possible. | B |
| ALERT | 3 | The ALERT pin is stuck high. The functionality of the ALERT pin is not available. | B |
| GND | 4 | The functionality of the device is undetermined. The device is potentially damaged. | A |
| A2 | 5 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| A1 | 6 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| A0 | 7 | The I2C address selection is limited. I2C communication is potentially corrupted. | B |
| V+ | 8 | There is no effect on the device. The device operates as normal. | D |