SLASEH4A November   2023  – December 2024 DAC61401 , DAC81401

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  ESD Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Thermal Information
    5. 5.5  Electrical Characteristics
    6. 5.6  Timing Requirements - Write, IOVDD = 1.7V to 2.7V
    7. 5.7  Timing Requirements - Write, IOVDD = 2.7V to 5.5V
    8. 5.8  Timing Requirements - Read and Daisy Chain, FSDO = 0, IOVDD = 1.7V to 2.7V
    9. 5.9  Timing Requirements - Read and Daisy Chain, FSDO = 1, IOVDD = 1.7V to 2.7V
    10. 5.10 Timing Requirements - Read and Daisy Chain, FSDO = 0, IOVDD = 2.7V to 5.5V
    11. 5.11 Timing Requirements - Read and Daisy Chain, FSDO = 1, IOVDD = 2.7V to 5.5V
    12. 5.12 Timing Diagrams
    13. 5.13 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Digital-to-Analog Converter (DAC) Architecture
      2. 6.3.2 R-2R Ladder DAC
      3. 6.3.3 Programmable Gain Output Buffer
      4. 6.3.4 Sense Pins
      5. 6.3.5 DAC Register Structure
        1. 6.3.5.1 Output Update
        2. 6.3.5.2 Software Clear
          1. 6.3.5.2.1 Software Reset Mode
      6. 6.3.6 Internal Reference
      7. 6.3.7 Power-Supply Sequence
        1. 6.3.7.1 Power-On Reset (POR)
      8. 6.3.8 Thermal Alarm
    4. 6.4 Device Functional Modes
      1. 6.4.1 Power Down Mode
    5. 6.5 Programming
      1. 6.5.1 Stand-Alone Operation
      2. 6.5.2 Daisy-Chain Operation
      3. 6.5.3 Frame Error Checking
  8. 7 Register Map
    1. 7.1 Registers
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Key Components
        2. 8.2.2.2 Compensation Capacitor
        3. 8.2.2.3 Gain Stage
        4. 8.2.2.4 Attenuation and Buffer Stage
        5. 8.2.2.5 External Power Supply
        6. 8.2.2.6 Protection Design
        7. 8.2.2.7 Design Accuracy
      3. 8.2.3 Application Curves
    3. 8.3 Initialization Set Up
    4. 8.4 Power Supply Recommendations
    5. 8.5 Layout
      1. 8.5.1 Layout Guidelines
      2. 8.5.2 Layout Examples
  10. 9 Device and Documentation Support
    1. 9.1 Receiving Notification of Documentation Updates
    2. 9.2 Support Resources
    3. 9.3 Trademarks
    4. 9.4 Electrostatic Discharge Caution
    5. 9.5 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

5.5 Electrical Characteristics

all minimum and maximum values at TA = –40°C to +125°C; all typical values at TA = 25°C, AVDD = 4.5V to 41.5V, AVSS = –21.5V to 0V, VDD = 5.0V, VREFIO = 2.5V (external reference), IOVDD = 1.7V, VSENSEN = 0V, DAC output unloaded, CCOMP unconnected, and digital inputs at IOVDD or GND (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
STATIC PERFORMANCE(1)
Resolution DAC81401 16 Bits
DAC61401 12 Bits
INL Relative accuracy(1) DAC81401,
all ranges except 0V to 40V range		 –1 ±0.4 1 LSB
DAC81401, 0V to 40V range –2 2 LSB
DAC61401 –1 1 LSB
DNL Differential nonlinearity –1 ±0.3 1 LSB
TUE Total unadjusted error(1) Unipolar ranges, AVSS = 0V –0.09 0.09 %FSR
Unipolar ranges, AVSS = 0V,
0°C ≤ TA ≤ 50°C		 –0.07 0.07
Bnipolar ranges, –21.5V ≤ AVSS < 0V –0.095 0.095
OE Offset error(1) Unipolar ranges, AVSS = 0V
Bipolar ranges, –21.5V ≤ AVSS < 0V		 –0.05 0.05 %FSR
OE-TC Offset error temperature coefficient Unipolar ranges, AVSS = 0V
Bipolar ranges, –21.5V ≤ AVSS < 0V		 ±2 ppmFSR/°C
ZCE Zero-code (negative full scale) error Unipolar ranges, AVSS = 0V 0.15 %FSR
Bipolar ranges, –21.5V ≤ AVSS < 0V 0.05
ZCE-TC Zero-code (negative full scale) error temperature coefficient Unipolar ranges, AVSS = 0V
Bipolar ranges, –21.5V ≤ AVSS < 0V		 ±2 ppmFSR/°C
FSE Full-scale error(2) Unipolar ranges, AVSS = 0V
Bipolar ranges, –21.5V ≤ AVSS < 0V		 –0.08 0.08 %FSR
FSE-TC Full-scale error temperature coefficient(2) ±3 ppmFSR/°C
GE Gain error(1) Unipolar ranges, AVSS = 0V –0.075 0.075 %FSR
BPGE Bipolar Gain error(1) Bipolar ranges, –21.5V ≤ AVSS < 0V –0.065 0.065 %FSR
GE-TC Gain error temperature coefficient ±2 ppmFSR/°C
BPZE Bipolar zero (midscale) error Bipolar ranges, –21.5V ≤ AVSS < 0V –0.04 0.04 %FSR
BPZE-TC Bipolar zero (midscale) error temperature coefficient Bipolar ranges, –21.5V ≤ AVSS < 0V ±2 ppmFSR/°C
Output voltage drift over time TA = 40°C, DAC code at full-scale, 1000 hours ±6 ppm FSR
OUTPUT CHARACTERISTICS
VOUT Output voltage  0 5 V
20% overrange of 0V to 5V 0 6
0 10
20% overrange of 0V to 10V 0 12
0 20
20% overrange of 0V to 20V 0 24
0 40
–5 5
20% overrange of –5V to +5V –6 6
–10 10
20% overrange of –10V to +10V –12 12
–20 20
Output voltage headroom (to AVDD) and footroom (to AVSS)(4) –10mA ≤ load current ≤ 10mA 1.25
5.5V < AVDD ≤ 41.5V, 
−15mA ≤ load current ≤ +15mA		 1.5 V
IOS Short-circuit current(3) Full-scale output shorted to AVSS 40 mA
Full-scale output shorted to AVDD,
5.5V < AVDD ≤ 41.5V,		 40
Zero-scale output shorted to AVDD,
4.5V ≤ AVDD ≤ 5.5V		 25
Load regulation DAC at midscale,
–15mA ≤ load current ≤ +15mA		 50 µV/mA
CL Capacitive load(4) RLOAD = open,
CCOMP pin left floating		 0 2 nF
RLOAD = open,
CCOMP pin = 470pF ±10% to VOUT		 1 µF
IL Load current(4) 5.5V < AVDD ≤ 41.5V 15 mA
4.5V < AVDD ≤ 5.5V 10
VOUT dc output impedance DAC code at midscale, DAC unloaded 0.05 Ω
DAC code at full scale, DAC unloaded 0.05
DAC code at zero scale,
DAC unloaded, unipolar output		 35
DAC code at negative full scale,
DAC unloaded, bipolar output		 0.05
VSENSEP dc output impedance DAC code at midscale, 10V span 55 kΩ
DAC disabled 45
DYNAMIC PERFORMANCE
Output voltage settling time 5V span, 1/4 to 3/4 scale and 3/4 to 1/4 scale, settling time to ±2LSB 7 µs
10V span, 1/4 to 3/4 scale and 3/4 to 1/4 scale, settling time to ±2LSB 8 µs
20V span, 1/4 to 3/4 scale and 3/4 to 1/4 scale, settling time to ±2LSB 12 µs
40V span, 1/4 to 3/4 scale and 3/4 to 1/4 scale, settling time to ±2LSB 22 µs
5V span, 1/4 to 3/4 scale and 3/4 to 1/4 scale, settling time to ±2LSB,
CL = 1µF, CCOMP = 470pF to VOUT		 0.6 ms
10V span, 1/4 to 3/4 scale and 3/4 to 1/4 scale, settling time to ±2LSB,
CL = 1µF, CCOMP = 470pF to VOUT		 0.6 ms
20V span, 1/4 to 3/4 scale and 3/4 to 1/4 scale, settling time to ±2LSB,
CL = 1µF, CCOMP = 470pF to VOUT		 0.6 ms
40V span, 1/4 to 3/4 scale and 3/4 to 1/4 scale, settling time to ±2LSB,
CL = 1µF, CCOMP = 470pF to VOUT		 1.2 ms
SR Slew rate 0V to 5V range (10% to 90% of full-scale range) 0.8 V/µs
All other output ranges except 40V span (10% to 90% of full-scale range) 4
0V to 5V range, CL = 1µF,
CCOMP = 470pF to VOUT		 0.04
All other ranges, CL = 1µF,
CCOMP = 470pF to VOUT		 0.04
Power-on glitch magnitude AVSS and AVDD ramped symmetrically, ramp rate = 18V/ms, output unloaded, internal reference 0.1 V
Output enable glitch magnitude AVSS and AVDD ramped, output unloaded, internal reference 0.35 V
VNOISEPP Output noise 0.1Hz to 10Hz,
DAC code at midscale,
10V span, external reference = 2.5V		 25 µVpp
0.1Hz to 10Hz,
DAC code at midscale,
10V span, internal reference = 2.5V		 30
VNOISE Output noise density 1kHz, DAC code at midscale,
5V span, output unloaded,
external reference		 115 nV/Hz
10kHz, DAC code at midscale,
5V span, output unloaded,
external reference		 105
THD Total harmonic distortion 1kHz sine wave on VOUT, output unloaded, DAC update rate = 400kHz 93 dB
PSRR-AC Power supply rejection ratio - ac VOUT = 0V (midscale),
output unloaded, ±10V output,
frequency = 60Hz,
amplitude 200mVPP,
superimposed on AVDD, VDD or AVSS		 75 dB
PSRR-DC Power supply rejection ratio - dc VOUT = 0V (midscale), ±10V output, VDD = 5V, AVDD = 15V ± 20%,
AVSS = –15V, output unloaded		 5 µV/V
VOUT = 0V (midscale), ±10V output, VDD = 5V, AVDD = 15V,
AVSS = –15V ± 20%, output unloaded		 10 µV/V
VOUT = 0V (midscale), ±10V output,
VDD = 5V ± 5%, AVDD = 15V,
AVSS = –15V, output unloaded		 0.2 mV/V
VGL Code change glitch impulse 1LSB change around midscale,
0V to 5V range, output unloaded		 1 nV-s
1LSB change around midscale,
0V to 10V range, output unloaded		 2
1LSB change around midscale,
–5V to +5V range, output unloaded		 2
1LSB change around midscale,
–10V to +10V range, output unloaded		 4
Code change glitch amplitude 1LSB change around midscale,
0V to 5V, 0V to 10V, –5V to +5V,
and –10V to +10V ranges,
output unloaded		 ±1.5 mV
Digital feedthrough DAC code at midscale, fSCLK = 1MHz, output unloaded 0.3 nV-s
EXTERNAL REFERENCE INPUT
VREFIO Reference input voltage 2.49 2.5 2.51 V
IREF Reference input current 50 µA
ZIN Reference input impedance 50 kΩ
CREF Reference input capacitance 90 pF
INTERNAL REFERENCE
VREFO Reference output voltage  TA = 25°C 2.4975 2.5025 V
Reference output drift(3) 5 10 ppm/°C
RZO Reference output impedance 0.15 Ω
VNOISEPP Reference output noise 0.1Hz to 10Hz 12 µVpp
VNOISE Reference output noise density 10kHz, VREFIO pin = 10nF 240 nV/Hz
IL Reference load current Source 5 mA
Reference load regulation Source 120 µV/mA
Reference line regulation 100 µV/V
Reference output drift over time TA = 40°C, 1000 hours ±300 µV
Reference thermal hysteresis First cycle ±400 µV
Additional cycle ±35
DIGITAL INPUTS AND OUTPUTS
VIH SDIN, high-level input voltage 0.7 × IOVDD V
VIL SDIN, low-level input voltage 0.3 × IOVDD V
Input current ±2 µA
Input pin capacitance 2 pF
VOH SDO, high-level output voltage SDO load current = 0.2mA IOVDD – 0.2 V
VOL SDO, low-level output voltage SDO load current = 0.2mA 0.4 V
FAULT, low-level output voltage FAULT load current = 10mA 0.4 V
Output pin capacitance 5 pF
POWER REQUIREMENTS(5)
IAVDD AVDD supply current(5) Normal mode, internal reference or external reference 1.6 mA
Power down mode 10 µA
IVDD VDD supply current(5) Digital interface static, internal reference or external reference 2.5 mA
IAVSS AVSS supply current(5) Normal mode, internal reference or external reference –1.6 mA
Power-down mode –10 µA
IIOVDD IOVDD supply current(5) SCLK toggling at 1MHz 10 120 µA
(1) End point fit between codes. 16bit: 512 to 65024 for AVDD ≥ 5.5V, 512 to 63488 for AVDD ≤ 5.5V, 0.2V headroom between VREFIO and AVDD; 12bit: 32 to 4064 for AVDD ≥ 5.5V, 32 to 3968 for AVDD ≤ 5.5V, 0.2V headroom between VREFIO and AVDD.
(2) Full-scale code written to the DAC for AVDD ≥ 5.5V. 16bit: code 63488 written to the DAC for AVDD ≤ 5.5V; 12bit: code 3968 written to the DAC for AVDD ≤ 5.5V.
(3) Temporary overload condition protection. Junction temperature can be exceeded during current limit. Operation greater than the specified maximum junction temperature can impair device reliability.
(4) Specified by design and characterization, not production tested.
(5) Time to exit power down mode to normal operation. Measured from last rising edge of SYNC to 90% of DAC final value.