SLLSES1D December   2015  – September 2020 HD3SS3220

PRODUCTION DATA  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Pin Configuration and Functions
    1.     Pin Functions
  6. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
  7. Detailed Description
    1. 7.1 Overview
      1. 7.1.1 Cables, Adapters, and Direct Connect Devices
        1. 7.1.1.1 USB Type-C receptacles and Plugs
        2. 7.1.1.2 USB Type-C Cables
        3. 7.1.1.3 Legacy Cables and Adapters
        4. 7.1.1.4 Direct Connect Device
        5. 7.1.1.5 Audio Adapters
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1  DFP/Source – Downstream Facing Port
      2. 7.3.2  UFP/Sink – Upstream Facing Port
      3. 7.3.3  DRP – Dual Role Port
      4. 7.3.4  Cable Orientation and Mux Control
      5. 7.3.5  Type-C Current Mode
      6. 7.3.6  Accessory Support
      7. 7.3.7  Audio Accessory
      8. 7.3.8  Debug Accessory
      9. 7.3.9  VCONN support for Active Cables
      10. 7.3.10 I2C and GPIO Control
      11. 7.3.11 HD3SS3220 V(BUS) Detection
      12. 7.3.12 VDD5 and VCC33 Power-On Requirements
    4. 7.4 Device Functional Modes
      1. 7.4.1 Unattached Mode
      2. 7.4.2 Active Mode
      3. 7.4.3 Dead Battery
      4. 7.4.4 Shutdown Mode
    5. 7.5 Programming
    6. 7.6 Register Maps
      1. 7.6.1 Device Identification Register (offset = 0x07 through 0x00) [reset = 0x00, 0x54, 0x55, 0x53, 0x42, 0x33, 0x32, 0x32]
      2. 7.6.2 Connection Status Register (offset = 0x08) [reset = 0x00]
      3. 7.6.3 Connection Status and Control Register (offset = 0x09) [reset = 0x20]
      4. 7.6.4 General Control Register (offset = 0x0A) [reset = 0x00]
      5. 7.6.5 Device Revision Register (offset = 0xA0) [reset = 0x02]
  8. Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application, DRP Port
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Typical Application, DFP Port
        1. 8.2.3.1 Design Requirements
        2. 8.2.3.2 Detailed Design Procedure
      4. 8.2.4 Typical Application, UFP Port
        1. 8.2.4.1 Design Requirements
        2. 8.2.4.2 Detailed Design Procedure
  9. Layout
    1. 9.1 Layout Guidelines
      1. 9.1.1 Suggested PCB Stackups
      2. 9.1.2 High-Speed Signal Trace Length Matching
      3. 9.1.3 Differential Signal Spacing
      4. 9.1.4 High-Speed Differential Signal Rules
      5. 9.1.5 Symmetry in the Differential Pairs
      6. 9.1.6 Via Discontinuity Mitigation
      7. 9.1.7 Surface-Mount Device Pad Discontinuity Mitigation
      8. 9.1.8 ESD/EMI Considerations
    2. 9.2 Layout
  10. 10Device and Documentation Support
    1. 10.1 Receiving Notification of Documentation Updates
    2. 10.2 Community Resources
    3. 10.3 Trademarks
  11. 11Mechanical, Packaging, and Orderable Information

High-Speed Differential Signal Rules

  • Do not place probe or test points on any high-speed differential signal.
  • Do not route high-speed traces under or near crystals, oscillators, clock signal generators, switching power regulators, mounting holes, magnetic devices, or ICs that use or duplicate clock signals.
  • After BGA breakout, keep high-speed differential signals clear of the SoC because high current transients produced during internal state transitions can be difficult to filter out.
  • When possible, route high-speed differential pair signals on the top or bottom layer of the PCB with an adjacent GND layer. TI does not recommend stripline routing of the high-speed differential signals.
  • Ensure that high-speed differential signals are routed ≥ 90 mils from the edge of the reference plane.
  • Ensure that high-speed differential signals are routed at least 1.5 W (calculated trace-width × 1.5) away from voids in the reference plane. This rule does not apply where SMD pads on high-speed differential signals are voided.
  • Maintain constant trace width after the SoC BGA escape to avoid impedance mismatches in the transmission lines.
  • Maximize differential pair-to-pair spacing when possible.