SLOK022 December   2024 TLV4H290-SEP

 

  1.   1
  2. 1TLV4H290-SEP Radiation Tolerant High-Speed Comparator TID Report
  3. 2Trademarks
  4. 3Device Information
    1. 3.1 Device Details
  5. 4Total Dose Test Setup
    1. 4.1 Test Overview
    2. 4.2 Test Description and Facilities
    3. 4.3 Test Setup Details
      1. 4.3.1 Unbiased
      2. 4.3.2 Biased
    4. 4.4 Test Configuration and Condition
  6. 5Tested Parameters
  7. 6Total Ionizing Dose RHA Characterization Summary Results
    1. 6.1 HDR Characterization Results
      1. 6.1.1 Input Bias Current
      2. 6.1.2 Output High Leakage
    2. 6.2 Summary of Results
  8.   A Appendix A: Total Ionizing Dose HDR Report
  9.   B Appendix B: Total Ionizing Dose HDR Report - Post-Anneal

6.1.2 Output High Leakage

Open-drain output leakage current (ILKG/IOH) for the TLV4H290-SEP is specified as 10nA typical at TA = 25°C. The output leakage current was measured at VS = 5V.

During radiation two channels were held output high, while two channels were held output low.

The channels where the outputs were held low showed additional leakage to 10µA post exposure to 30krad(Si) under HDR.

After annealing under biased conditions (t = 3 days), output leakage on channels held low reduced. For example, sample 19 reduced output leakage from 10µA to 6.9µA on channel 3.