SLOS052E October   1987  – July 2025 TLC27L2 , TLC27L2A , TLC27L2B , TLC27L2M , TLC27L7

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1  Absolute Maximum Ratings
    2. 5.2  Dissipation Ratings
    3. 5.3  Recommended Operating Conditions
    4. 5.4  Electrical Characteristics, VDD = 5V, C Suffix
    5. 5.5  Operating Characteristics, VDD = 5V, C Suffix
    6. 5.6  Electrical Characteristics, VDD = 10V, C Suffix
    7. 5.7  Operating Characteristics, VDD = 10V, C Suffix
    8. 5.8  Electrical Characteristics, VDD = 5V, I Suffix
    9. 5.9  Operating Characteristics, VDD = 5V, I Suffix
    10. 5.10 Electrical Characteristics, VDD = 10V, I Suffix
    11. 5.11 Operating Characteristics, VDD = 10V, I Suffix
    12. 5.12 Electrical Characteristics, VDD = 5V, M Suffix
    13. 5.13 Operating Characteristics, VDD = 5V, M Suffix
    14. 5.14 Electrical Characteristics, VDD = 10V, M Suffix
    15. 5.15 Operating Characteristics, VDD = 10V, M Suffix
    16. 5.16 Typical Characteristics
  7. 6 Parameter Measurement Information
    1. 6.1 Single-Supply Versus Split-Supply Test Circuits
    2. 6.2 Input Bias Current
    3. 6.3 Low-Level Output Voltage
    4. 6.4 Input Offset Voltage Temperature Coefficient
    5. 6.5 Full-Power Response
    6. 6.6 Test Time
  8. 7 Application and Implementation
    1. 7.1 Application Information
      1. 7.1.1 Single-Supply Operation
      2. 7.1.2 Input Characteristics
      3. 7.1.3 Noise Performance
      4. 7.1.4 Feedback
      5. 7.1.5 Electrostatic Discharge Protection
      6. 7.1.6 Latch-Up
      7. 7.1.7 Output Characteristics
      8. 7.1.8 Typical Applications
  9. 8 Device and Documentation Support
    1. 8.1 Receiving Notification of Documentation Updates
    2. 8.2 Support Resources
    3. 8.3 Trademarks
    4. 8.4 Electrostatic Discharge Caution
    5. 8.5 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

8.4 Electrostatic Discharge Caution

TLC27L2 TLC27L2A TLC27L2B TLC27L7 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.