SLOS548A September   2007  – June 2026 TL082-Q1

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Electrical Characteristics
    4. 5.4 Operating Characteristics
    5. 5.5 Typical Characteristics
    6. 5.6 Old Versus New Die Comparison
  7. 6 Parameter Measurement Information
  8. 7 Application Information
    1. 7.1 Application Information Disclaimer
    2. 7.2 Application Information
  9. 8 Device and Documentation Support
    1. 8.1 Receiving Notification of Documentation Updates
    2. 8.2 Support Resources
    3. 8.3 Trademarks
    4. 8.4 Electrostatic Discharge Caution
    5. 8.5 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

5.4 Operating Characteristics

VCC± = ±15V, TA = 25°C (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
SR Slew rate at unity gain(1) RL = 2kΩ, CL = 100pF VID = 1V 21 V/μs
VID = 100mV 0.5
Vn Equivalent input noise voltage RS = 20Ω f = 1kHz 10.8 nV/√ Hz
f = 0.1Hz to 10Hz 1.8 μVPP
In Equivalent input noise current RS = 20Ω, f = 1kHz 2 fA/√ Hz
THD Total harmonic distortion VIrms = 6V, f = 1kHz, AVD = 1, RS ≤ 1kΩ, RL ≥ 2kΩ 0.003 %
New Die, VS = 40V, VO = 3VRMS, G = 1, f = 1kHz 0.00021 %
(1) The new die has a slew boost architecture. For more details, see Full Power Bandwidth and Op Amp Distortion