SLVK166 January   2024 TMS570LC4357-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Texas Instruments Enhanced Product Qualification and Reliability Report
  5. 2Space Enhanced Production Flow
    1. 2.1 Device Introduction
    2. 2.2 TMS570LC4357-SEP Production Flow
  6. 3Device Qualification
    1.     9
    2. 3.1 Space Enhanced Products New Device Qualification Matrix
  7. 4Outgas Test Report

Abstract

The TMS570LC4357-SEP device is part of the Hercules TMS570 series of high-performance Arm® Cortex®-R-based MCUs. The TMS570LC4357-SEP device features on-chip diagnostic features including: dual CPUs in lockstep, Built-In Self-Test (BIST) logic for CPU, the N2HET coprocessors, and for on-chip SRAMs; ECC protection on the L1 caches, L2 flash, and SRAM memories. The device also supports ECC or parity protection on peripheral memories and loopback capability on peripheral I/Os.

The TMS570LC4357-SEP is manufactured with a controlled baseline and features the following:

  • One assembly and test site
  • Product traceability
  • An extended product life cycle