SLVK232 February   2026 TPS7H4104-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Safe Operating Area (SOA) Results
    2. 7.2 Single-Event Latch-up (SEL) Results
    3. 7.3 Single-Event Burnout (SEB) and Single-Event Gate Rupture (SEGR) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A References

7.2 Single-Event Latch-up (SEL) Results

During the SEL testing the device was heated to 125°C using a PID controlled heat gun (MISTRAL 6 System (120V, 2400W)). The die temperature was verified using a standalone FLIR thermal camera prior to exposure to heavy ions at KSEE.

The species used for the SEL testing was 169Tm (KSEE) at 19.5 MeV/nucleon. An angle of incidence of 0° was used to achieve a LETEFF of ≈ 75 MeV·cm2/mg (for more details refer to Section 5). The kinetic energy in the vacuum for 169Tm is 3.295 GeV. Flux of ≈ 105 ions/cm2/s and a fluence of ≈107 ions/cm2 per run was used. Run duration to achieve this fluence was ≈2 minutes. The 4 devices were powered up for SEL at the maximum recommended operating conditions based on the SOA, which are a VIN of 6.5V and 3A/channel in the high current case and a VIN of 7V and 1.5A/channel in the high voltage case. Output conditions were tested in two different configurations, either with each channel configured to output 1.2V or 1.8V. During testing of the 4 devices, the TPS7H4104-SP did not exhibit any SEL under heavy-ions with LETEFF = 75 MeV·cm2/mg at flux ≈105 ions/cm2/s, fluence of ≈107 ions/cm2, and a die temperature of 125°C, while maintaining operating conditions within the SOA. Table 8-9 shows the SEL test conditions and results. Figure 7-3 shows a plot of the current vs time for run #2. Figure 7-4 shows a plot of the current vs time for run #3.

Table 7-6 Summary of TPS7H4104-SP SEL Test Condition and Results
Run #Unit #

Facility

IonLETEFF (MeV·cm2/mg)Flux (ions/cm2/s)Fluence (ions/cm2)

VIN

VOUT (V)

IOUT/Channel (A)

SEL (# Events)

11

KSEE

169Tm

75

1.07 x 105

1 x 107

7

1.2

1.5

0

22

KSEE

169Tm

75

1.02 x 105

1 x 107

7

1.8

1.5

0

33

KSEE

169Tm

75

9.05 x 104

1 x 107

6.5

1.2

3

0

4

4

KSEE

169Tm

75

9.74 x 104

1 x 107

6.5

1.8

3

0

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report and combining (or summing) the fluences of the four runs at 125°C (4 × 107 ions/cm2), the upper-bound cross-section (using a 95% confidence level) is calculated as:

σSEL ≤ 9.22 x 10-8 cm2/device for LETEFF = 75 MeV·cm2/mg and T = 125°C.

Current versus Time for Run #2 of the TPS7H4104-SP at T = 125°C (VIN = 7V, VOUT = 1.8V, IOUT = 1.5A/ch)Figure 7-3 Current versus Time for Run #2 of the TPS7H4104-SP at T = 125°C (VIN = 7V, VOUT = 1.8V, IOUT = 1.5A/ch)
Current versus Time for Run #3 of the TPS7H4104-SP at T = 125°C (VIN = 6.5V, VOUT = 1.2V, IOUT = 3A/ch)Figure 7-4 Current versus Time for Run #3 of the TPS7H4104-SP at T = 125°C (VIN = 6.5V, VOUT = 1.2V, IOUT = 3A/ch)