SLVSHF5 November   2024 TLC6989

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Device Comparison
  6. 5 Pin Configuration and Functions
  7. 6 Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Thermal Information
    4. 6.4 Recommended Operating Conditions
    5. 6.5 Electrical Characteristics
    6. 6.6 Timing Requirements
    7. 6.7 Switching Characteristics
    8. 6.8 Timing Diagrams
    9. 6.9 Typical Characteristics
  8. 7 Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Internal Oscillator and Clocks
        1. 7.3.1.1 System Clock
        2. 7.3.1.2 Continuous Clock Serial Interface (CCSI) Clock
      2. 7.3.2 Continuous Clock Serial Interface (CCSI)
        1. 7.3.2.1 Command Format
        2. 7.3.2.2 Command Recognition and Synchronization
        3. 7.3.2.3 CCSI Command Queue
        4. 7.3.2.4 CCSI Start Bit and Check Bits Insertion and Removal
      3. 7.3.3 FIFO
        1. 7.3.3.1 FIFO level and Data Ready (DRDY) Interrupt
        2. 7.3.3.2 FIFO Clearance
      4. 7.3.4 Diagnostics
        1. 7.3.4.1  Undervoltage Lockout
        2. 7.3.4.2  Oscillator Fault Diagnostics
        3. 7.3.4.3  SPI Communications Loss
        4. 7.3.4.4  SPI Communications Error
          1. 7.3.4.4.1 Reset Timer
          2. 7.3.4.4.2 Chip Select (CS) Reset
          3. 7.3.4.4.3 CRC Error
          4. 7.3.4.4.4 Register write failure
        5. 7.3.4.5  CCSI Communications Loss
          1. 7.3.4.5.1 SIN Stuck-at Diagnostics
        6. 7.3.4.6  CCSI Communications Error
          1. 7.3.4.6.1 CHECK Bit Error
          2. 7.3.4.6.2 Data Integrity Diagnostics
          3. 7.3.4.6.3 CCSI Command Queue Overflow
        7. 7.3.4.7  FIFO Diagnostics
          1. 7.3.4.7.1 TXFIFO Overflow
          2. 7.3.4.7.2 TXFIFO Underflow
          3. 7.3.4.7.3 TXFIFO Single Error Detection (SED)
          4. 7.3.4.7.4 RXFIFO Overflow
          5. 7.3.4.7.5 RXFIFO Underflow
          6. 7.3.4.7.6 RXFIFO Single Error Detection (SED)
        8. 7.3.4.8  OTP CRC Error
        9. 7.3.4.9  Fault Masking
        10. 7.3.4.10 Diagnostics Table
    4. 7.4 Device Functional Modes
      1. 7.4.1 Unpowered
      2. 7.4.2 Initialization State
      3. 7.4.3 Normal State
      4. 7.4.4 Failsafe State
    5. 7.5 Programming
      1. 7.5.1 SPI Data Validity
      2. 7.5.2 Chip Select (CS) and SPI Reset Control
      3. 7.5.3 SPI Command Format
      4. 7.5.4 SPI Command Detail
    6. 7.6 Device Registers
  9. 8 Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
        1. 8.2.2.1 Programming Procedure
      3. 8.2.3 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. 9 Device and Documentation Support
    1. 9.1 Device Support
    2. 9.2 Documentation Support
      1. 9.2.1 Related Documentation
    3. 9.3 Receiving Notification of Documentation Updates
    4. 9.4 Support Resources
    5. 9.5 Trademarks
    6. 9.6 Electrostatic Discharge Caution
    7. 9.7 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information
    1. 11.1 Tape and Reel Information
    2. 11.2 Mechanical Data

6.6 Timing Requirements

PARAMETER TEST CONDITIONS MIN NOM MAX UNIT
fSCLK,NORMAL SCLK clock frequency in NORMAL state 20 MHz
fSCLK,INIT SCLK clock frequency in INIT state 5 MHz
tLEAD,CS Delay time, first SCLK rising edge after CS falling edge 15 ns
tLAG,CS Delay time, CS rising edge after final SCLK falling edge 5 ns
tSU,SDI SDI input data setup time before SCLK rising egde 10 ns
tHD,SDI SDI input data hold time after SCLK rising edge 5 ns
twh,CS Pulse duration, CS high 40 ns
tSU,SIN SIN input data setup time before CLK_O rising and falling edge 10 ns
tHD,SIN SIN input data hold time after CLK_O rising and falling edge 2 ns